scholarly journals Reflectance Spectra Analysis Algorithms for the Characterization of Deposits and Condensed Traces on Surfaces

2022 ◽  
Author(s):  
Ran Aharoni ◽  
Asaf Zuck ◽  
David Peri ◽  
Shai Kendler

Identification of particulate matter and liquid spills contaminations is essential for many applications, such as forensics, agriculture, security, and environmental protection. For example, toxic industrial compounds deposition in the form of aerosols, or other residual contaminations, pose a secondary, long-lasting health concern due to resuspension and secondary evaporation. This chapter explores several approaches for employing diffuse reflectance spectroscopy in the mid-IR and SWIR to identify particles and films of materials in field conditions. Since the behavior of thin films and particles is more complex compared to absorption spectroscopy of pure compounds, due to the interactions with background materials, the use of physical models combined with statistically-based algorithms for material classification, provides a reliable and practical solution and will be presented.

Materials ◽  
2019 ◽  
Vol 12 (2) ◽  
pp. 251 ◽  
Author(s):  
Juli-Anna Dolyniuk ◽  
Justin Mark ◽  
Shannon Lee ◽  
Nhon Tran ◽  
Kirill Kovnir

The synthesis, structural characterization, and optical properties of the binary Zintl phases of α-EuP3, β-EuP3, EuP2, and α-K4P6 are reported in this study. These crystal structures demonstrate the versatility of P fragments with dimensionality varying from 0D (P6 rings in α-K4P6) to 1D chains (EuP2) to 2D layers (both EuP3). EuP2 is isostructural to previously reported SrP2 and BaP2 compounds. The thermal stabilities of the EuP2 and both EuP3 phases were determined using differential scanning calorimetry (DSC), with melting temperatures of 1086 K for the diphosphide and 1143 K for the triphosphides. Diffuse reflectance spectroscopy indicated that EuP2 is an indirect semiconductor with a direct bandgap of 1.12(5) eV and a smaller indirect one, less than 1 eV. Both EuP3 compounds had bandgaps smaller than 1 eV.


2019 ◽  
Vol 9 (22) ◽  
pp. 4933 ◽  
Author(s):  
Sergej Bock ◽  
Christian Kijatkin ◽  
Dirk Berben ◽  
Mirco Imlau

This paper addresses the challenging task of optical characterization of pure, dielectric (nano-)powders with the aim to provide an end-to-end instruction from appropriate sample preparation up to the determination of material remission and absorption spectra. We succeeded in establishing an innovative preparation procedure to reproducibly obtain powder pellet samples with an ideal Lambertian scattering behavior. As a result, a procedure based on diffuse reflectance spectroscopy was developed that allows for (i) performing reproducible and artifact-free, high-quality measurements as well as (ii) a thorough optical analysis using Monte Carlo and Mie scattering simulations yielding the absorption spectrum in the visible spectral range. The procedure is valid for the particular case of powders that can be compressed into thick, non-translucent pellets and neither requires embedding of the dielectric (nano-)powders within an appropriate host matrix for measurements nor the use of integrating spheres. The reduced spectroscopic procedure minimizes the large number of sources for errors, enables an in-depth understanding of non-avoidable artifacts and is of particular advantage in the field of material sciences, i.e., for getting first insights to the optical features of a newly synthesized, pure dielectric powder, but also as an inline inspection tool for massively parallelised material characterization.


1994 ◽  
Vol 23 (3-4) ◽  
pp. 263-269 ◽  
Author(s):  
V. B. Kazansky ◽  
V. Yu. Borovkov ◽  
N. Sokolova ◽  
N. I. Jaeger ◽  
G. Schulz-Ekloff

1997 ◽  
Vol 101 (3) ◽  
pp. 309-316 ◽  
Author(s):  
W. Sjoerd Kijlstra ◽  
Eduard K. Poels ◽  
Alfred Bliek ◽  
Bert M. Weckhuysen ◽  
Robert A. Schoonheydt

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