DETERMINATION OF THE GAP STATE DISTRIBUTION IN a-Si:H BY THE METHOD OF INTERNAL PHOTOEMISSION TRANSIENT CURRENT TEMPERATURE SPECTROSCOPY
1985 ◽
Vol 77-78
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pp. 355-358
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1988 ◽
Vol 49
(11)
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pp. 1933-1950
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Keyword(s):
2014 ◽
Vol 94
(21)
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pp. 2447-2471
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1981 ◽
Vol 20
(7)
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pp. L549-L552
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1984 ◽
Vol 66
(1-2)
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pp. 187-192
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1996 ◽
Vol 100
(19)
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pp. 7972-7980
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Keyword(s):
2005 ◽
Vol 402
(1-3)
◽
pp. 265-269
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