STUDY ON HOT-CARRIER-EFFECT FOR GROOVED-GATE N-CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTOR
2005 ◽
Vol 44
(8)
◽
pp. 5889-5892
◽
2014 ◽
Vol 53
(4S)
◽
pp. 04EP17
◽
1990 ◽
Vol 29
(Part 2, No. 12)
◽
pp. L2286-L2288
◽
Keyword(s):
2000 ◽
Vol 39
(Part 2, No. 1A/B)
◽
pp. L28-L30
1998 ◽
Vol 16
(2)
◽
pp. 855-859
◽
2003 ◽
Vol 42
(Part 1, No. 4B)
◽
pp. 1993-1998