Site-Specific Atomic and Electronic Structure Analysis of Epitaxial Silicon Oxynitride Thin Film on SiC(0001) by Photoelectron and Auger Electron Diffractions

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Fumihiko Matsui ◽  
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Tomohiro Matsushita ◽  
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J. Pollmann

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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


Hyomen Kagaku ◽  
2004 ◽  
Vol 25 (9) ◽  
pp. 555-561
Author(s):  
Iwao SHIMOYAMA ◽  
Yuji BABA ◽  
Tetsuhiro SEKIGUCHI ◽  
Krishna G. NATH

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