Site-Specific Atomic and Electronic Structure Analysis of Epitaxial Silicon Oxynitride Thin Film on SiC(0001) by Photoelectron and Auger Electron Diffractions
2014 ◽
Vol 83
(4)
◽
pp. 044604
◽
1999 ◽
Vol 60
(20)
◽
pp. 14311-14317
◽
Keyword(s):
Keyword(s):
1990 ◽
Vol 8
(3)
◽
pp. 2236-2240
◽
Keyword(s):
2006 ◽
Vol 106
(11-12)
◽
pp. 1019-1023
◽
Keyword(s):
2002 ◽
Vol 51
(suppl 1)
◽
pp. S265-S270
◽
Keyword(s):