Characterization of Random Telegraph Noise Generated by Process- and Cycling-Stress-Induced Traps in 26 nm NAND Flash Memory

2013 ◽  
Vol 52 (4S) ◽  
pp. 04CA07 ◽  
Author(s):  
Bong-Su Jo ◽  
Ho-Jung Kang ◽  
Sung-Min Joe ◽  
Min-Kyu Jeong ◽  
Kyung-Rok Han ◽  
...  
2014 ◽  
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pp. 125001 ◽  
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Min-Kyu Jeong ◽  
Sung-Min Joe ◽  
Byung-Gook Park ◽  
Jong-Ho Lee

2015 ◽  
Vol 36 (7) ◽  
pp. 678-680 ◽  
Author(s):  
Davide Resnati ◽  
Christian Monzio Compagnoni ◽  
Giovanni M. Paolucci ◽  
Carmine Miccoli ◽  
Alessandro S. Spinelli ◽  
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2014 ◽  
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pp. 125013 ◽  
Author(s):  
Sung-Min Joe ◽  
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pp. 635-637 ◽  
Author(s):  
Sung-Min Joe ◽  
Jeong-Hyong Yi ◽  
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Hyuck-In Kwon ◽  
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2012 ◽  
Vol 59 (12) ◽  
pp. 3568-3573 ◽  
Author(s):  
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Min-Kyu Jeong ◽  
Bong-Su Jo ◽  
Kyoung-Rok Han ◽  
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