Characterization of Random Telegraph Noise Generated by Process- and Cycling-Stress-Induced Traps in 26 nm NAND Flash Memory
2013 ◽
Vol 52
(4S)
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pp. 04CA07
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2014 ◽
Vol 29
(12)
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pp. 125001
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2019 ◽
Vol 19
(2)
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pp. 153-157
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2014 ◽
2015 ◽
Vol 36
(7)
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pp. 678-680
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Keyword(s):
2014 ◽
Vol 29
(12)
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pp. 125013
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2010 ◽
Vol 31
(7)
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pp. 635-637
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2012 ◽
Vol 59
(12)
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pp. 3568-3573
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Keyword(s):
Keyword(s):