Effect of Bias Temperature Stress on the Anti-Reflection HfO2Layer in Complementary Metal Oxide Semiconductor Image Sensors

Hyung-Joon Kim; Kyung-Su Lee; Pyungho Choi; Kwang-Soo Kim; Dohyun Baek; Byoungdeog Choi

doi:10.7567/jjap.52.10mc02

Effect of Bias Temperature Stress on the Anti-Reflection HfO2Layer in Complementary Metal Oxide Semiconductor Image Sensors

Japanese Journal of Applied Physics ◽

10.7567/jjap.52.10mc02 ◽

2013 ◽

Vol 52 (10S) ◽

pp. 10MC02 ◽

Cited By ~ 1

Author(s):

Hyung-Joon Kim ◽

Kyung-Su Lee ◽

Pyungho Choi ◽

Kwang-Soo Kim ◽

Dohyun Baek ◽

...

Keyword(s):

Metal Oxide ◽

Temperature Stress ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Bias Temperature Stress

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Floating zone silicon wafer bonded to Czochralski silicon substrate by surface-activated bonding at room temperature for infrared complementary metal-oxide-semiconductor image sensors

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abcdb4 ◽

2020 ◽

Vol 60 (1) ◽

pp. 015502

Author(s):

Yoshihiro Koga ◽

Kazunari Kurita

Keyword(s):

Metal Oxide ◽

Silicon Wafer ◽

Silicon Substrate ◽

Room Temperature ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Floating Zone ◽

Czochralski Silicon

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Recent trends in the development of complementary metal oxide semiconductor image sensors to detect foodborne bacterial pathogens

TrAC Trends in Analytical Chemistry ◽

10.1016/j.trac.2017.10.019 ◽

2018 ◽

Vol 98 ◽

pp. 47-57 ◽

Cited By ~ 8

Author(s):

Buddolla Viswanath ◽

Yuzon Ma Kristine ◽

Sanghyo Kim

Keyword(s):

Metal Oxide ◽

Bacterial Pathogens ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Recent Trends

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Modeling the dark current histogram induced by gold contamination in complementary-metal-oxide-semiconductor image sensors

Journal of Applied Physics ◽

10.1063/1.4922969 ◽

2015 ◽

Vol 118 (2) ◽

pp. 024501 ◽

Cited By ~ 6

Author(s):

F. Domengie ◽

P. Morin ◽

D. Bauza

Keyword(s):

Metal Oxide ◽

Dark Current ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor

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Complementary metal-oxide-semiconductor (CMOS) image sensors for use in space

High Performance Silicon Imaging ◽

10.1533/9780857097521.2.250 ◽

2014 ◽

pp. 250-280 ◽

Cited By ~ 1

Author(s):

J. Bogaerts

Keyword(s):

Metal Oxide ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Cmos Image Sensors

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Smart cameras on a chip: using complementary metal-oxide-semiconductor (CMOS) image sensors to create smart vision chips

High Performance Silicon Imaging ◽

10.1533/9780857097521.1.165 ◽

2014 ◽

pp. 165-188

Author(s):

D. Ginhac

Keyword(s):

Metal Oxide ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Smart Cameras ◽

Vision Chips ◽

Cmos Image Sensors

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Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensors

Acta Physica Sinica ◽

10.7498/aps.65.024212 ◽

2016 ◽

Vol 65 (2) ◽

pp. 024212

Author(s):

Wang Fan ◽

Li Yu-Dong ◽

Guo Qi ◽

Wang Bo ◽

Zhang Xing-Yao ◽

...

Keyword(s):

Metal Oxide ◽

Radiation Effects ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Total Ionizing Dose ◽

Dose Radiation

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Investigation of degradation behavior under negative bias temperature stress in Si/Si0.8Ge0.2 metal-oxide-semiconductor capacitors

Journal of Physics D Applied Physics ◽

10.1088/1361-6463/ac1bd2 ◽

2021 ◽

Author(s):

Yen-Cheng Chang ◽

Chien-Yu Lin ◽

Ting-Chang Chang ◽

Yun-Hsuan Lin ◽

Kuan-Hsu Chen ◽

...

Keyword(s):

Metal Oxide ◽

Temperature Stress ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Negative Bias ◽

Degradation Behavior ◽

Bias Temperature Stress

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A New Photodiode Model for SPICE Simulation of Complementary Metal–Oxide–Semiconductor Image Sensors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.2352 ◽

2007 ◽

Vol 46 (4B) ◽

pp. 2352-2359 ◽

Cited By ~ 1

Author(s):

Wen-Jen Chiang ◽

Hung-Chu Chen ◽

Ya-Chin King

Keyword(s):

Metal Oxide ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Spice Simulation

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Backside illuminated (BSI) complementary metal-oxide-semiconductor (CMOS) image sensors

High Performance Silicon Imaging ◽

10.1016/b978-0-08-102434-8.00004-0 ◽

2020 ◽

pp. 95-117

Author(s):

A. Lahav ◽

A. Fenigstein ◽

A. Strum ◽

S. Rizzolo

Keyword(s):

Metal Oxide ◽

Complementary Metal Oxide Semiconductor ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Cmos Image Sensors ◽

Backside Illuminated

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Reduction of Random Noise in Complementary Metal Oxide Semiconductor Image Sensors by Gate Oxide Interface Control

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.3466 ◽

2006 ◽

Vol 45 (4B) ◽

pp. 3466-3469 ◽

Cited By ~ 3

Author(s):

Jongwan Jung ◽

Doowon Kwon ◽

Duck-Hyung Lee

Keyword(s):

Metal Oxide ◽

Random Noise ◽

Complementary Metal Oxide Semiconductor ◽

Gate Oxide ◽

Image Sensors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Oxide Interface ◽

Interface Control

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