Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor

2016 ◽  
Vol 55 (6S1) ◽  
pp. 06GJ12 ◽  
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Takahiro Nagata ◽  
Somu Kumaragurubaran ◽  
Yoshifumi Tsunekawa ◽  
Yoshiyuki Yamashita ◽  
Shigenori Ueda ◽  
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Rajeev Ranjan ◽  
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Dmytro Trots ◽  
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2015 ◽  
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