Top-gate pentacene-based organic field-effect transistor with amorphous rubrene gate insulator

2018 ◽  
Vol 57 (2S2) ◽  
pp. 02CA08 ◽  
Author(s):  
Mizuha Hiroki ◽  
Yasutaka Maeda ◽  
Shun-ichiro Ohmi
2005 ◽  
Vol 44 (6A) ◽  
pp. 3721-3727 ◽  
Author(s):  
Achmad Zen ◽  
Dieter Neher ◽  
Kamel Silmy ◽  
Andreas Holländer ◽  
Udom Asawapirom ◽  
...  

2005 ◽  
Vol 86 (14) ◽  
pp. 143513 ◽  
Author(s):  
Eriko Mizuno ◽  
Masateru Taniguchi ◽  
Tomoji Kawai

2011 ◽  
Vol 110 (9) ◽  
pp. 094508 ◽  
Author(s):  
Lucieli Rossi ◽  
Keli F. Seidel ◽  
Wagner S. Machado ◽  
Ivo A. Hümmelgen

2011 ◽  
Vol 10 (04n05) ◽  
pp. 765-769 ◽  
Author(s):  
A. DAS ◽  
S. RAJAGOPALAN ◽  
S. DHARA ◽  
K. PRABAKAR ◽  
S. DASH ◽  
...  

The High k thin films of ZrO2 were deposited by electron beam evaporation for creating high capacitance devices. Capacitance as high as 0.2 μF/cm2 is obtained for the 80 nm thick ZrO2 films that forms thickness equivalent of SiO2 ~16 nm (t eq ). Grazing incidence XRD confirmed crystalline tetragonal phase. Morphology of ZrO2 films investigated using atomic force microscopy showed high roughness and pin holes that related to high leakage current. Whereas low leakage anodized Al nanogate insulator (t eq of SiO2 ~ 3.55 nm) were prepared varying the voltage and utilized as high capacitance gate oxide to realize low powered organic field effect transistor with polytriarylamine semiconductor. The observed threshold voltage is 0.35V.


ACS Photonics ◽  
2021 ◽  
Author(s):  
Haripriya Kesavan ◽  
Subhamoy Sahoo ◽  
Sanjoy Jena ◽  
Jayeeta Bhattacharyya ◽  
Debdutta Ray

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