Investigation of Low-Cost Stress Memorization Process on Layout and Low-Frequency Noise Performance for Strained-Si nMOSFETs
Keyword(s):
Low Cost
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2011 ◽
Vol 50
(4)
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pp. 04DC20
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2007 ◽
Vol 28
(1)
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pp. 36-38
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Keyword(s):
2003 ◽
Vol 24
(9)
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pp. 535-537
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2017 ◽
Vol 17
(10)
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pp. 7107-7114
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Keyword(s):
2005 ◽
Vol 152
(9)
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pp. F115
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