Low Frequency Noise Analysis in Strained-Si Devices

Advances in Intelligent Systems and Computing - Emerging Technology in Modelling and Graphics ◽

10.1007/978-981-13-7403-6_37 ◽

2019 ◽

pp. 409-417

Author(s):

Sanghamitra Das ◽

Tara Prasanna Dash ◽

Chinmay Kumar Maiti

Keyword(s):

Noise Analysis ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

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Current Conduction Model for Oxide-Based Resistive Random Access Memory Verified by Low-Frequency Noise Analysis

IEEE Transactions on Electron Devices ◽

10.1109/ted.2013.2240457 ◽

2013 ◽

Vol 60 (3) ◽

pp. 1272-1275 ◽

Author(s):

Z. Fang ◽

H. Y. Yu ◽

W. J. Fan ◽

G. Ghibaudo ◽

J. Buckley ◽

...

Keyword(s):

Noise Analysis ◽

Random Access ◽

Low Frequency ◽

Random Access Memory ◽

Resistive Random Access Memory ◽

Frequency Noise ◽

Low Frequency Noise ◽

Access Memory ◽

Conduction Model ◽

Current Conduction

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Low-Frequency Noise Characteristics in Strained-Si nMOSFETs

IEEE Electron Device Letters ◽

10.1109/led.2006.887632 ◽

2007 ◽

Vol 28 (1) ◽

pp. 36-38 ◽

Author(s):

Yen Ping Wang ◽

San Lein Wu ◽

Shoou Jinn Chang

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Strained Si ◽

Noise Characteristics

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Double Barrier Height Nature of Ti/p-Type Strained Si-On-Insulator Schottky Diode and Its Low Frequency Noise Characteristics

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2017.14748 ◽

2017 ◽

Vol 17 (10) ◽

pp. 7107-7114 ◽

Author(s):

I Jyothi ◽

Hoon-Ki Lee ◽

V Janardhanam ◽

Sung-Nam Lee ◽

Chel-Jong Choi

Keyword(s):

Barrier Height ◽

Schottky Diode ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Double Barrier ◽

Strained Si ◽

Noise Characteristics ◽

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Low-frequency noise analysis of Si/SiGe channel pMOSFETs

Solid-State Electronics ◽

10.1016/s0038-1101(02)00231-9 ◽

2002 ◽

Vol 46 (12) ◽

pp. 2281-2285 ◽

Author(s):

P.W Li ◽

W.M Liao

Keyword(s):

Noise Analysis ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise

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Characterization and modeling of base current in n-p-n polysilicon emitter bipolar transistors using low-frequency noise analysis

10.1117/12.186749 ◽

1994 ◽

Author(s):

David Quon ◽

Yang H. Chang ◽

Gregory J. Sonek ◽

Guann-pyng Li

Keyword(s):

Noise Analysis ◽

Low Frequency ◽

Bipolar Transistors ◽

Frequency Noise ◽

Low Frequency Noise ◽

Base Current ◽

Polysilicon Emitter

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Comparative low frequency noise analysis in various SOI devices: floating body, body-tied, DTMOS with and without current limiter

2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) ◽

10.1109/soi.2000.892802 ◽

2002 ◽

Author(s):

S. Haendler ◽

J. Jomaah ◽

F. Balestra ◽

J.L. Pelloie

Keyword(s):

Noise Analysis ◽

Low Frequency ◽

Floating Body ◽

Frequency Noise ◽

Low Frequency Noise ◽

Current Limiter ◽

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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs

2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/eurosoi-ulis45800.2019.9041918 ◽

2019 ◽

Author(s):

D. Boudier ◽

B. Cretu ◽

E. Simoen ◽

G. Hellings ◽

T. Schram ◽

...

Keyword(s):

Noise Analysis ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise

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Conduction Mechanism and Low Frequency Noise Analysis in Al/Pr0.7Ca0.3MnO3for Bipolar Resistive Switching

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.011501 ◽

2011 ◽

Vol 50 (1R) ◽

pp. 011501 ◽

Author(s):

Myoung-Sun Lee ◽

Jung-Kyu Lee ◽

Hyun-Sang Hwang ◽

Hyung-Cheol Shin ◽

Byung-Gook Park ◽

...

Keyword(s):

Resistive Switching ◽

Conduction Mechanism ◽

Noise Analysis ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Bipolar Resistive Switching

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Investigation of Low-Cost Stress Memorization Process on Layout and Low-Frequency Noise Performance for Strained-Si nMOSFETs

10.7567/ssdm.2010.p-3-13 ◽

2010 ◽

Author(s):

C. W. Kuo ◽

S. L. Wu ◽

H. Y. Lin ◽

Y. T. Huang ◽

S. J. Chang ◽

...

Keyword(s):

Low Cost ◽

Low Frequency ◽

Frequency Noise ◽

Noise Performance ◽

Low Frequency Noise ◽

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Impact of P/E cycling on read current fluctuation of NOR Flash memory cell: A microscopic perspective based on low frequency noise analysis

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112748 ◽

2015 ◽

Author(s):

Xiaonan Yang ◽

Jing Liu ◽

Zhiwei Zheng ◽

Yan Wang ◽

Dandan Jiang ◽

...

Keyword(s):

Flash Memory ◽

Noise Analysis ◽

Low Frequency ◽

Memory Cell ◽

Frequency Noise ◽

Low Frequency Noise ◽

Current Fluctuation ◽

Flash Memory Cell ◽

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