angular diffraction
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2021 ◽  
Author(s):  
song qiu ◽  
yuan ren ◽  
Tong Liu ◽  
Zhengliang Liu ◽  
Chen Wang ◽  
...  

2020 ◽  
Vol 108 ◽  
pp. 107920 ◽  
Author(s):  
Filippo S. Boi ◽  
Gao Shuai ◽  
Jiqiu Wen ◽  
Shanling Wang

2017 ◽  
Vol 50 (3) ◽  
pp. 851-858 ◽  
Author(s):  
M. A. Steiner ◽  
J. R. Bunn ◽  
J. R. Einhorn ◽  
E. Garlea ◽  
E. A. Payzant ◽  
...  

This study reports an angular diffraction peak shift that scales linearly with the neutron beam path length traveled through a diffracting sample. This shift was observed in the context of mapping the residual stress state of a large U–8 wt% Mo casting, as well as during complementary measurements on a smaller casting of the same material. If uncorrected, this peak shift implies a non-physical level of residual stress. A hypothesis for the origin of this shift is presented, based upon non-ideal focusing of the neutron monochromator in combination with changes to the wavelength distribution reaching the detector due to factors such as attenuation. The magnitude of the shift is observed to vary linearly with the width of the diffraction peak reaching the detector. Consideration of this shift will be important for strain measurements requiring long path lengths through samples with significant attenuation. This effect can probably be reduced by selecting smaller voxel slit widths.


2017 ◽  
Vol 158 ◽  
pp. 21-36 ◽  
Author(s):  
Pavel Roy Paladhi ◽  
Amin Tayebi ◽  
Portia Banerjee ◽  
Lalita Udpa ◽  
Satish Udpa

2012 ◽  
Vol 14 (5) ◽  
pp. 055707 ◽  
Author(s):  
H X Cui ◽  
X L Wang ◽  
B Gu ◽  
Y N Li ◽  
J Chen ◽  
...  

2010 ◽  
Vol 59 (6) ◽  
pp. 3930
Author(s):  
Ren Yu-Xuan ◽  
Wu Jian-Guang ◽  
Zhou Xiao-Wei ◽  
Fu Shao-Jun ◽  
Sun Qing ◽  
...  

2009 ◽  
Author(s):  
S. Franke-Arnold ◽  
B. Jack ◽  
J. Leach ◽  
M. J. Padgett
Keyword(s):  

2008 ◽  
Vol 10 (10) ◽  
pp. 103013 ◽  
Author(s):  
B Jack ◽  
M J Padgett ◽  
S Franke-Arnold
Keyword(s):  

1998 ◽  
Vol 05 (01) ◽  
pp. 63-67
Author(s):  
Y. He ◽  
L.-M. Yu ◽  
P. A. Thiry ◽  
R. Caudano

The surface vibrations of H-terminated Si(111) are investigated by high resolution electron energy loss spectroscopy (HREELS). Clear evidence is obtained for reassigning the electron resonant scattering from a surface resonance to a negative ion resonance mechanism. Since the electrons emitted from the trapping states show characteristic angular diffraction patterns realated with the geometric and vibrational symmetries of the surface, we suggest the possibility of using this system to investigate vibrationally resolved electron diffraction processes.


1991 ◽  
Vol 258 (1-3) ◽  
pp. A602
Author(s):  
Z.-L. Han ◽  
S. Hardcastle ◽  
G.R. Harp ◽  
H. Li ◽  
X.-D. Wang ◽  
...  

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