atomic force microscopy technique
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2008 ◽  
Vol 22 (30) ◽  
pp. 3007-3013 ◽  
Author(s):  
D. M. BHARDWAJ ◽  
D. C. JAIN ◽  
RAVI KUMAR ◽  
R. P. GUPTA ◽  
K. B. GARG

XANES measurements at the Fe - K edge on natural South African sapphire single crystal (corundum) and an irradiated sample with fluence 1 × 1012 Ni 6+ ions/cm 2 are reported. Some decrease in intensity of pre-edge features (1s → 3d) and increase in intensity of 1s → 4p transition in Fe is observed with Ni fluence. Structural changes and modification on surface of irradiated sapphire with Ni 6+ ion have been observed by the atomic force microscopy technique and discussed in the term of defects.


1996 ◽  
Vol 51 (2) ◽  
pp. 621-626
Author(s):  
Shigeru FUKUSHIMA ◽  
Tetsuo OHASHI ◽  
Kouichi KOJIMA ◽  
Yoshifumi TAKEDA

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