Atomic force microscopy technique for the surface characterization of sol–gel derived multi-component silica nanocomposites

2016 ◽  
Vol 504 ◽  
pp. 350-357 ◽  
Author(s):  
Magdalena Prokopowicz
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Sol Gel ◽  
Force Microscopy ◽  
Silica Nanocomposites ◽  
Atomic Force Microscopy Technique ◽  
Microscopy Technique ◽  
Atomic Force

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force

XANES AND ATOMIC FORCE MICROSCOPY STUDIES ON PRE- AND POST-IRRADIATED SAPPHIRE

2008 ◽  
Vol 22 (30) ◽  
pp. 3007-3013 ◽  
Author(s):  
D. M. BHARDWAJ ◽  
D. C. JAIN ◽  
RAVI KUMAR ◽  
R. P. GUPTA ◽  
K. B. GARG
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
South African ◽  
Structural Changes ◽  
Force Microscopy ◽  
Atomic Force Microscopy Technique ◽  
Microscopy Technique ◽  
Atomic Force ◽  
Sapphire Single Crystal ◽  
Edge Features

XANES measurements at the Fe - K edge on natural South African sapphire single crystal (corundum) and an irradiated sample with fluence 1 × 1012 Ni 6+ ions/cm 2 are reported. Some decrease in intensity of pre-edge features (1s → 3d) and increase in intensity of 1s → 4p transition in Fe is observed with Ni fluence. Structural changes and modification on surface of irradiated sapphire with Ni 6+ ion have been observed by the atomic force microscopy technique and discussed in the term of defects.

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