The ErF3-doped oxyfluoride phospho-tellurite glasses in the (40-x) TeO2-10P2O5-45 (BaF2-ZnF2) -5Na2O-xErF3 system (where x = 0.25, 0.50, 0.75, 1.00, and 1.25 mol%) have been prepared by the conventional melt-quenching method. The effect of erbium trifluoride addition on thermal, structure, and spectroscopic properties of oxyfluoride phospho-tellurite precursor glass was studied by differential scanning calorimetry (DSC), Fourier-transform infrared (FTIR), and Raman spectroscopy as well as emission measurements, respectively. The DSC curves were used to investigate characteristic temperatures and thermal stability of the precursor glass doped with varying content of ErF3. FTIR and Raman spectra were introduced to characterize the evolution of structure and phonon energy of the glasses. It was found that the addition of ErF3 up to 1.25 mol% into the chemical composition of phospho-tellurite precursor glass enhanced 2.7 µm emission and upconversion. By controlled heat-treatment process of the host glass doped with the highest content of erbium trifluoride (1.25 mol%), transparent erbium-doped phospho-tellurite glass-ceramic (GC) was obtained. X-ray diffraction analysis confirmed the presence of BaF2 nanocrystals with the average 16 nm diameter in a glass matrix. Moreover, MIR, NIR, and UC emissions of the glass-ceramic were discussed in detail and compared to the spectroscopic properties of the glass doped with 1.25 mol% of ErF3 (the base glass).
Spectroscopic Properties of Erbium-Doped Oxyfluoride Phospho-Tellurite Glass and Transparent Glass-Ceramic Containing BaF2 Nanocrystals
