ABSTRACTIn this study we report on the KrF excimer laser deposition of crystalline films of lead magnesium niobium oxide (PMN) and solid solutions of PMN and lead titanate (PT) in a 65:35 ratio. These materials have potential microelectronic applications as thin film capacitors due to their high dielectric constants (εPMN(bulk) ≥ 10,000). Films were typically deposited in an oxygen background at elevated substrate temperatures(Ts = 525 °C) on substrates of Pt(111)/SiO2/Si or Pt(111)/glass. The deposited films were characterized by Rutherford Backscattering Spectroscopy (RBS), x-ray diffraction, and capacitance/loss measurements. Films prepared from a nearlystoichiometric commercial PMN target were low in Mg and Pb and yielded only the low-c pyrochlore phase (measured εfilm ≃ 100), even after cx-situ annealing at temperatures up to 650°C. Films deposited from Pb,Mg-rich targets prepared by a sol-gel process (tailored to produce the desired film stoichiometry) contained mixtures of perovskite and pyrochlore, with typical r values of order 600–1200.