A Method for Measuring LC Resonance Frequency by Impulse Response

LC circuit resonance frequency measurement often requires the use of professional analysis instruments such as LCR meters, vector network analyzers, but currently such instruments on the market are expensive, and it is difficult for non-professional institute personnel to access. Here comes unnecessary trouble. In view of this situation, a test method for measuring the resonance frequency using only a digital storage oscilloscope is proposed. Using the impulse signal to obtain the system response, the response waveform period can be observed through the oscilloscope.

Detection of Skin Cancer using Optical Method

Skin is the one of the most important organ present in our body that does some of the important functions like protection, temperature regulation etc. Due to some conditions, skin is affected by many abnormalities. The abnormalities may be smaller or larger, which depends on the damage caused to the skin. Some abnormalities of skin are irritations, allergic reactions, swelling etc. One of the most major problems that affect the skin completely is of skin cancer. Skin cancer is the most common type of cancer that affects the 40% of people in all over world. It may be caused due to several factors like genetic, working in hazardous chemical areas, exposure to sun, repeated X-ray exposures etc. All of these factors affects the skin and causes skin cancer. Skin biopsy is a major technique used at present to detect all types of skin cancers. As this biopsy method is invasive, and takes more time to check the cancer tissue, we are using this optical method for detection of skin cancer. Optical imaging is the upcoming technology that plays the major role in all fields. In this method Near Infra-Red (NIR) light source is passed into the affected skin region. The transimpedance amplifier is used to amplify the output from photodiodes. Then the output from the photodiodes is connected to the Digital Storage Oscilloscope (DSO) in which the waveform shows the variations due to skin cancer.

Multichannel Photon Counting Lidar Measurements Using USB-based Digital Storage Oscilloscope

We present a simple method of making multichannel photon counting measurements of weak lidar signal from large ranges, using commonly available USB-based digital storage oscilloscopes. The single photon pulses from compact photomultiplier tubes are amplified and stretched so that the pulses are large and broad enough to be sampled efficiently by the USB oscilloscopes. A software interface written in Labview is then used to count the number of photon pulses in each of the prescribed time bins to form the histogram of LIDAR signal. This method presents a flexible alternative to the modular multichannel scalers and facilitate the development of sensitive lidar systems.

DEFLECTED STATE OF SEMICONDUCTOR NEAR-CONTACT REGION AT ELECTRODEGRADATION OF METALLIZATION TRACK ON ITS SURFACE

It is well known that a nonhomogeneous state of stress occurs in compounds of dissimilar materials upon heating. Uon the assessment of the strength of the joints, it is necessary to factor in the physical specifications of the soldered elements, the geometric dimensions and temperature conditions of their operation. The purpose of the research was to perform the stress-strain state analysis of the contact zone of a semiconductor upon electrodegradation of a metallization track on its surface. Thin-film metal-semiconductor structures were researched. As substrates, it was used phosphorus-doped silicon single-crystal wafers oriented in the (111) and (100) directions, with a resistivity in the range p = 1 ... 0.01 Ω.cm, and a 30 ... 50 μm n-epitaxial layer was deposited on a part of the wafers. As a conductive metal film, aluminum 1 ... 2 μm thick was used. The test structure was formed by optical photolithography. The oscillograms of the U(t) inclusion in the process of passage of the current pulse were taken by the corresponding probes from potential sites and recorded by a digital storage oscilloscope. An estimation procedure for the semiconductor stressed region at local surface heating of a metallized surface area with electric pulse was given. The calculated size of deformed silicon substrate region was compared with the experimental one under passage of square electric pulses. It was estimated the deflected region that depends on duration and amplitude of electric pulse. A considerable nonuniformity of the metallization track after electric pulse passage was fixed experimentally.

Research and Development on an Embedded Digital Storage Oscilloscope Based on PXA 270

This paper discusses the chief techniques and design principles of an embedded digital storage oscilloscope based on PXA 270, using FPGA as logic controller cell. The data acquisition partition consists of pre-process circuit, A/D converter, on-board memories, and control circuit integrated in FPGA. In the PB and EVC development environment, developers realized the part of embedded software. Actual test showed that the highest real-time sampling rate of the oscilloscope is up to 1GHz/s, which has achieved the desired design requirements.