Planar phase-variation microwave sensors have attracted increasing interest in recent years since they combine the advantages of planar technology (including low cost, low profile, and sensor integration with the associated circuitry for post-processing and communication purposes, among others) and the possibility of operation at a single frequency (thereby reducing the costs of the associated electronics). This paper reviews and compares three different strategies for sensitivity improvement in such phase-variation sensors (devoted to material characterization). The considered approaches include line elongation (through meandering), dispersion engineering (by considering slow-wave artificial transmission lines), and reflective-mode sensors based on step-impedance open-ended lines. It is shown that unprecedented sensitivities compatible with small sensing regions are achievable with the latter approach.
Planar Phase-Variation Microwave Sensors for Material Characterization: A Review and Comparison of Various Approaches
