layout extraction
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2021 ◽  
pp. 497-513
Author(s):  
Meng Ling ◽  
Jian Chen ◽  
Torsten Möller ◽  
Petra Isenberg ◽  
Tobias Isenberg ◽  
...  

2019 ◽  
Vol 59 (3) ◽  
pp. 203-210
Author(s):  
Marek Bureš ◽  
Sergo Martirosov ◽  
Jiří Polcar

The paper is focused on point cloud data processing obtained by 3D laser scanning. The scanning devices are at a very advanced level and after reaching their possible maximum scanning speeds, manufacturers are now more focused on a minimization of the devices. However, there is still a lack of software solutions for a simple and successful model creation from point cloud data or data evaluation. This paper briefly describes the laser scanning principle and the process of production floor layout capturing. Furthermore, a newly developed algorithm for an extraction of specific areas of point cloud is introduced. The algorithm was tested and compared with other solutions for a production layout development. After testing, the standalone software application called CloudSlicer™ was programed and the user interface is also presented.


2018 ◽  
Vol 2 (4) ◽  
pp. 322-332
Author(s):  
Raul Quijada ◽  
Roger Dura ◽  
Jofre Pallares ◽  
Xavier Formatje ◽  
Salvador Hidalgo ◽  
...  

Author(s):  
William Kao ◽  
Chi-Yuan Lo ◽  
Mark Basel ◽  
Raminderpal Singh ◽  
Peter Spink ◽  
...  
Keyword(s):  

Author(s):  
Roger Durà ◽  
Jofre Pallarès ◽  
Raúl Quijada ◽  
Xavier Formatjé ◽  
Salvador Hidalgo ◽  
...  

Abstract This paper proposes a compact and robust topology descriptor for the automated identification of logic gates during the reverse engineering of full integrated circuits (ICs). This gate signature proves to be very insensitive to technology scaling, device sizing or layout extraction accuracy. Based on this new descriptor, an automated gate identification tool named Gate-X is implemented on top of commercial IC design tools. The speed tests for a practical 100k-gate digital IC example show that the complete sea of gates can be identified in a few hours.


Author(s):  
Heloise Alheritiere ◽  
Florence Cloppet ◽  
Camille Kurtz ◽  
Jean-Marc Ogier ◽  
Nicole Vincent

Author(s):  
William Kao ◽  
Chi-Yuan Lo ◽  
Mark Basel ◽  
Raminderpal Singh ◽  
Peter Spink ◽  
...  
Keyword(s):  

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