VLSI Electronics Microstructure Science
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17

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3

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Published By Elsevier

9780122341038

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The Effects of Materials Technology and Fabrication Tolerances on Guided-Wave Optical Communication and Signal Processing

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50014-6 ◽

1982 ◽

pp. 347-373

Author(s):

WILLIAM S.C. CHANG

Keyword(s):

Signal Processing ◽

Optical Communication ◽

Guided Wave ◽

Fabrication Tolerances

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Ultra-High-Speed GaAs VLSI: Approaches, Potential, and Progress* *The planar LSI SDFL GaAs integrated circuit work at Rockwell International was supported in part by the Advanced Research Projects Agency of the Department of Defense and was monitored by the Air Force Office of Scientific Research under Contract F49620–77-C-0087.

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50010-9 ◽

1982 ◽

pp. 109-162 ◽

Author(s):

RICHARD C. EDEN ◽

BRYANT M. WELCH

Keyword(s):

Air Force ◽

Department Of Defense ◽

Integrated Circuit ◽

Scientific Research ◽

Research Projects ◽

Ultra High Speed ◽

Advanced Research Projects Agency

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Design, Fabrication, and Performance of CCD Imagers

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50009-2 ◽

1982 ◽

pp. 65-107 ◽

Author(s):

R.H. DYCK

Keyword(s):

And Performance

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Index

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50016-x ◽

1982 ◽

pp. 439-450

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The Numerical Physics of Micron-Length and Submicron-Length Semiconductor Devices

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50012-2 ◽

1982 ◽

pp. 197-300 ◽

Author(s):

H.L. GRUBIN ◽

D.K. FERRY ◽

G.J. IAFRATE ◽

J.R. BARKER

Keyword(s):

Semiconductor Devices

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VLSI Design and Design Aid Requirements

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50008-0 ◽

1982 ◽

pp. 25-64

Author(s):

CHARLES HOUSE ◽

KENT HARDAGE

Keyword(s):

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Dedication

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50004-3 ◽

1982 ◽

pp. v

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The Impact of VLSI on CAM

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50015-8 ◽

1982 ◽

pp. 375-438

Author(s):

RAYMOND A. KRASS ◽

LESTER A. GERHARDT

Keyword(s):

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Optical Linewidth Measurements on Photomasks and Wafers† †Contribution of the National Bureau of Standards; not subject to copyright.

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50013-4 ◽

1982 ◽

pp. 301-346 ◽

Author(s):

W.M. BULLIS ◽

D. NYYSSONEN

Keyword(s):

National Bureau

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Copyright page

VLSI Electronics Microstructure Science ◽

10.1016/b978-0-12-234103-8.50003-1 ◽

1982 ◽

pp. iv

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