Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems
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103

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Published By IEEE

0780330935

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Radiation sources in the picosecond range

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509762 ◽

2002 ◽

Author(s):

S. Joly ◽

G. Haouat ◽

J. di Crescenzo ◽

S. Striby

Keyword(s):

Radiation Sources

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Gamma and neutron irradiation of optoelectronic devices

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509837 ◽

2002 ◽

Author(s):

H. Liscka ◽

H. Henschel ◽

O. Kohn ◽

W. Lennartz ◽

S. Metzger ◽

...

Keyword(s):

Neutron Irradiation ◽

Optoelectronic Devices

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Total dose effects on elementary transistors of a comparator in bipolar technology

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509781 ◽

2002 ◽

Cited By ~ 5

Author(s):

J.M. Bosc ◽

G. Sarrabayrouse ◽

F.X. Guerre

Keyword(s):

Total Dose ◽

Bipolar Technology ◽

Dose Effects ◽

Total Dose Effects

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LHC power diodes irradiated at 77 K in the field of a high energy accelerator

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509760 ◽

2002 ◽

Author(s):

V. Berland ◽

A. Gharib ◽

D. Hageborn ◽

M. Tavlet

Keyword(s):

High Energy ◽

Power Diodes ◽

High Energy Accelerator

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Post-irradiation effects in a rad-hard technology

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509763 ◽

2002 ◽

Author(s):

C. Chabrerie ◽

O. Musseau ◽

O. Flament ◽

J.-L. Leray ◽

J.-C. Boudenot ◽

...

Keyword(s):

Irradiation Effects ◽

Post Irradiation

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The use of pMOS dosimeters at megagray total doses

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509826 ◽

2002 ◽

Cited By ~ 2

Author(s):

R.E. Sharp ◽

S.L. Pater

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Avalanche semiconductor radiation detectors

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509820 ◽

2002 ◽

Author(s):

Z.Y. Sadygov ◽

I.M. Zheleznykh ◽

N.A. Malakhov ◽

V.N. Jejer ◽

T.A. Kirillova

Keyword(s):

Radiation Detectors

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System level radiation response of a high performance fiber optic data bus

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509833 ◽

2002 ◽

Cited By ~ 3

Author(s):

C.J. Dale ◽

P.W. Marshall ◽

M.E. Fritz ◽

M. de La Chapelle ◽

M.A. Carts ◽

...

Keyword(s):

High Performance ◽

Fiber Optic ◽

System Level ◽

Radiation Response ◽

High Performance Fiber ◽

Data Bus

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Widening the range in measuring neutron fluences with PIN silicon diodes

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509823 ◽

2002 ◽

Cited By ~ 2

Author(s):

J. Morin ◽

J.C. Arnoud ◽

J. David ◽

P. Zyromski

Keyword(s):

Neutron Fluences

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ADC performance drift trade-off: a case study

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems ◽

10.1109/radecs.1995.509795 ◽

2002 ◽

Cited By ~ 1

Author(s):

P. Dautriche ◽

J.P. Aubert ◽

D. Vellou

Keyword(s):

Trade Off

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Proceedings of the Third European Conference on Radiation and its Effects on Components and SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Radiation sources in the picosecond range

Gamma and neutron irradiation of optoelectronic devices

Total dose effects on elementary transistors of a comparator in bipolar technology

LHC power diodes irradiated at 77 K in the field of a high energy accelerator

Post-irradiation effects in a rad-hard technology

The use of pMOS dosimeters at megagray total doses

Avalanche semiconductor radiation detectors

System level radiation response of a high performance fiber optic data bus

Widening the range in measuring neutron fluences with PIN silicon diodes

ADC performance drift trade-off: a case study

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems
Latest Publications