2021 IEEE European Test Symposium (ETS)
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9781665418492
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Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring

2021 ◽  
Author(s):  
Kazuki Monta ◽  
Leonidas Kataselas ◽  
Ferenc Fodor ◽  
Alkis Hatzopoulos ◽  
Makoto Nagata ◽  
...  
Keyword(s):  
Pattern Generation ◽  
Ir Drop ◽  
On Chip

NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories

2021 ◽  
Author(s):  
Soyed Tuhin Ahmed ◽  
Michael Hefenbrock ◽  
Christopher Munch ◽  
Mehdi B. Tahoori

scholarly journals Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*

2021 ◽  
Author(s):  
Alberto Bosio ◽  
Ian O'Connor ◽  
Marcello Traiola ◽  
Jorge Echavarria ◽  
Jurgen Teich ◽  
...  
Keyword(s):  
Challenges And Opportunities

scholarly journals Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks

2021 ◽  
Author(s):  
Maria Mushtaq ◽  
David Novo ◽  
Florent Bruguier ◽  
Pascal Benoit ◽  
Muhammad Khurram Bhatti
Keyword(s):  
Defense Mechanism

scholarly journals System-Level Access to On-Chip Instruments

2021 ◽  
Author(s):  
Erik Larsson ◽  
Shashi Kiran Gangaraju ◽  
Prathamesh Murali
Keyword(s):  
System Level ◽  
On Chip
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