Advances in X-Ray Analysis
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TOTAL DOCUMENTS

57

(FIVE YEARS 0)

H-INDEX

4

(FIVE YEARS 0)

Published By Springer US

9781461399957, 9781461399933

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Sample Preparation and Methodology for X-Ray Quantitative Analysis of Thin Aerosol Layers Deposited on Glass Fiber and Membrane Filters

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_44 ◽

1982 ◽

pp. 295-300 ◽

Cited By ~ 4

Author(s):

Briant L. Davis ◽

L. Ronald Johnson

Keyword(s):

Quantitative Analysis ◽

Sample Preparation ◽

Glass Fiber ◽

X Ray ◽

Membrane Filters

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Calibration of the Diffractometer at Low Values of Two Theta

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_43 ◽

1982 ◽

pp. 289-294 ◽

Cited By ~ 2

Author(s):

R. Jenkins ◽

T. Hom ◽

C. Villamizar ◽

W. N. Schreiner

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The Gas Proportional Scintillation Counter as a Room-Temperature Detector for Energy-Dispersive X-Ray Fluorescence Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_4 ◽

1982 ◽

pp. 39-44 ◽

Cited By ~ 1

Author(s):

C. A. N. Conde ◽

L. F. Requicha Ferreira ◽

A. J. de Campos

Keyword(s):

Room Temperature ◽

Scintillation Counter ◽

Fluorescence Analysis ◽

Energy Dispersive ◽

X Ray ◽

Temperature Detector

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A Second Generation Automated Powder Diffractometer Control System

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_38 ◽

1982 ◽

pp. 245-260 ◽

Cited By ~ 4

Author(s):

Robert L. Snyder ◽

Camden R. Hubbard ◽

Nicolas C. Panagiotopoulos

Keyword(s):

Control System ◽

Second Generation ◽

Powder Diffractometer

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X-Ray Diffraction Phase Analysis Using Microcomputers

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_37 ◽

1982 ◽

pp. 237-244 ◽

Cited By ~ 1

Author(s):

T. M. Hare ◽

J. C. Russ ◽

M. J. Lanzo

Keyword(s):

Phase Analysis ◽

X Ray Diffraction ◽

X Ray

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Automatically Correcting for Specimen Displacement Error During XRD Search/Match Identification

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_36 ◽

1982 ◽

pp. 231-236 ◽

Cited By ~ 1

Author(s):

Walter N. Schreiner ◽

Ronald Jenkins

Keyword(s):

Displacement Error

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A New Computer Algorithm for Qualitative X-Ray Powder Diffraction Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_34 ◽

1982 ◽

pp. 213-219 ◽

Cited By ~ 3

Author(s):

T. C. Huang ◽

W. Parrish

Keyword(s):

Diffraction Analysis ◽

Powder Diffraction ◽

Computer Algorithm ◽

X Ray

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Accurate PIXE Analysis of Thin Samples, Aerosol Loaded Filters and Surface Layers of Thick Samples

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_31 ◽

1982 ◽

pp. 195-199 ◽

Cited By ~ 1

Author(s):

U. Wätjen ◽

F.-W. Richter

Keyword(s):

Surface Layers ◽

Pixe Analysis ◽

Thin Samples

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A Resin-Loaded Paper X-Ray Fluorescence Method for Determining Uranium in Phosphate Materials

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_15 ◽

1982 ◽

pp. 107-111

Author(s):

Benjamin W. Haynes ◽

Jerome Zabronsky ◽

David L. Neylan

Keyword(s):

Fluorescence Method ◽

X Ray

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Volatilization of Sulfur in Fusion Techniques for Preparation of Discs for X-Ray Fluorescence Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9993-3_12 ◽

1982 ◽

pp. 91-94 ◽

Cited By ~ 4

Author(s):

James W. Baker

Keyword(s):

Fluorescence Analysis ◽

X Ray

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