X-Ray Diffraction Phase Analysis Using Microcomputers

1982 ◽  
pp. 237-244 ◽  
Author(s):  
T. M. Hare ◽  
J. C. Russ ◽  
M. J. Lanzo
2021 ◽  
Vol 103 (3) ◽  
pp. 67-73
Author(s):  
A.A. Toibek ◽  
◽  
K.T. Rustembekov ◽  
D.A. Kaikenov ◽  
M. Stoev ◽  
...  

For the first time, double gadolinium tellurites of the composition GdMIITeO4.5 (MII — Sr, Ba) were synthesized by the solid-phase method. The solid-phase synthesis of samples was carried out from decrepitated gadolinium (III) and tellurium (IV) oxides, strontium, and barium carbonates according to the standard ceramic technology. The synthesis was carried out in the temperature range of 800-1100 °C. The samples obtained were confirmed by X-ray phase analysis. X-ray phase analysis was carried out on an Empyrean instrument in the XRDML Pananalitical format. The intensity of the diffraction maxima was estimated on a 100-point scale. X-ray diffraction patterns indexing of the powder of gadolinium tellurites — alkaline earth metals studied were carried out by the homology method. The reliability and correctness of the results of indexing the X-ray diffraction patterns are confirmed by the good agreement between the experimental and calculated values of the interplanar distances (d) and the agreement between the values of the X-ray and pycnometric densities. It was found that compounds GdSrTeO4.5 and GdBaTeO4.5 crystallize in the monoclinic system and have the unit cell parameters, namely GdSrTeO4.5 — a = 12.7610, b = 10.4289, c = 8.6235 Å, V° = 1141.83 Å3, β = 95.77°, Z = 5, ρrent. = 3.22, ρpikn. = (3.10±0.09) g/cm3; GdBaTeO4.5 — a = 15.7272, b = 15.8351, c = 7.1393 Å, V° = 1769.72 Å3, β = 95.53°, Z = 8, ρrent = 3.71, ρpick = (3.61±0.10) g/cm3. Using the Landiya method, the standard heat capacities of the compounds were estimated from the calculated values of the standard entropies, and the temperature dependences of the heat capacities of the gadolinium tellurites synthesized were determined in the temperature range of 298–850 K.


Author(s):  
Marek Kotrlý

The majority of expert examination in forensic science is concerned with comparison, determination, and description of diversified samples. X-ray diffraction (powdered and/or single crystal) is bringing big benefits and analytical possibilities into forensic expert work, which are not easily provided by other methods. XRD methods are used in combination with other analytical methods (SEM with EDS/WDS, micro XRF, optical microscopy, FTIR, etc.).Importance of XRD phase analysis in forensic science lies namely in: analysis of relatively small-volume samples, relatively non-destructive, exact phase analysis, quantitative analysis (in majority of cases). And method is conclusive for a court.


1966 ◽  
Vol 38 (12) ◽  
pp. 1741-1745 ◽  
Author(s):  
R. F. Karlak ◽  
D. S. Burnett

1957 ◽  
Vol 1 ◽  
pp. 39-58
Author(s):  
Ralph H. Hiltz ◽  
Stanley L. Lopata

AbstractIn view of present difficulties encountered in met alio graphic methods of phase analysis of titanium and its alloys, the possibility of utilizing integrated X-ray intensities for phase analysis was investigated. Power Formula variables were calculated for titanium, and relative areas of three alpha and one beta peak were determined. Recorded X-ray intensities were obtained from a large number of titanium specimens. The recorded intensities were analyzed and the results compared with those from metallographic analysis. The errors in the method arising from the nature of titanium, texture and peak overlapping, were studied and where possible, compensated for by adjusting the method of measurement and calculation.


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