2015 IEEE International Integrated Reliability Workshop (IIRW)
Latest Publications

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9781467373951, 9781467373968

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Field-induced generation of electron traps in the tunnel oxide of flash memory cells

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437077 ◽

2015 ◽

Cited By ~ 1

Author(s):

Yuri Tkachev

Keyword(s):

Flash Memory ◽

Memory Cells ◽

Electron Traps

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Nanoscopic techniques for studying dielectric breakdown and switching induced morphological changes and defects

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437097 ◽

2015 ◽

Author(s):

K.L. Pey

Keyword(s):

Dielectric Breakdown ◽

Morphological Changes

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2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437010 ◽

2015 ◽

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Charge-based stochastic aging analysis of CMOS circuits

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437084 ◽

2015 ◽

Cited By ~ 2

Author(s):

Theodor Hillebrand ◽

Nico Hellwege ◽

Nils Heidmann ◽

Steffen Paul ◽

Dagmar Peters-Drolshagen

Keyword(s):

Cmos Circuits

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Solid-State-Drive qualification and reliability strategy

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437056 ◽

2015 ◽

Cited By ~ 4

Author(s):

Todd A. Marquart

Keyword(s):

Solid State ◽

Solid State Drive

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Call for papers

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437053 ◽

2015 ◽

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Polysilicon resistor degradation - modeling and mechanism

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437080 ◽

2015 ◽

Cited By ~ 1

Author(s):

Sankaran Jayanarayanan

Keyword(s):

Degradation Modeling

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Comparison between recoverable and permanent NBTI variability components

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437074 ◽

2015 ◽

Author(s):

D. Nouguier ◽

M. Rafik ◽

X. Federspiel ◽

D. Nouguier ◽

G. Ghibaudo

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A sampling approach for efficient BEOL TDDB assessment

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437066 ◽

2015 ◽

Author(s):

Andrew Kim ◽

Cathryn Christiansen ◽

Baozhen Li ◽

Ernest Wu ◽

Paul McLaughlin

Keyword(s):

Sampling Approach

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Reliability aging and modeling of chip-package interaction on logic technologies featuring high-k metal gate planar and FinFET transistors

2015 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2015.7437068 ◽

2015 ◽

Cited By ~ 1

Author(s):

Jen-Hao Lee ◽

Eliot S.H. Chen ◽

Yung-Huei Lee ◽

Chun-Hung Lin ◽

Chun-Yu Wu ◽

...

Keyword(s):

Metal Gate ◽

High K

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2015 IEEE International Integrated Reliability Workshop (IIRW)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Field-induced generation of electron traps in the tunnel oxide of flash memory cells

Nanoscopic techniques for studying dielectric breakdown and switching induced morphological changes and defects

Table of contents

Charge-based stochastic aging analysis of CMOS circuits

Solid-State-Drive qualification and reliability strategy

Call for papers

Polysilicon resistor degradation - modeling and mechanism

Comparison between recoverable and permanent NBTI variability components

A sampling approach for efficient BEOL TDDB assessment

Reliability aging and modeling of chip-package interaction on logic technologies featuring high-k metal gate planar and FinFET transistors

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2015 IEEE International Integrated Reliability Workshop (IIRW)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Field-induced generation of electron traps in the tunnel oxide of flash memory cells

Nanoscopic techniques for studying dielectric breakdown and switching induced morphological changes and defects

Table of contents

Charge-based stochastic aging analysis of CMOS circuits

Solid-State-Drive qualification and reliability strategy

Call for papers

Polysilicon resistor degradation - modeling and mechanism

Comparison between recoverable and permanent NBTI variability components

A sampling approach for efficient BEOL TDDB assessment

Reliability aging and modeling of chip-package interaction on logic technologies featuring high-k metal gate planar and FinFET transistors

2015 IEEE International Integrated Reliability Workshop (IIRW)
Latest Publications