Field-induced generation of electron traps in the tunnel oxide of flash memory cells

2015 ◽  
Author(s):  
Yuri Tkachev
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Electron Traps

Fluorine Effects Originating From the CVD-W Process on Charge-Trap Flash Memory Cells

2019 ◽  
Vol 66 (1) ◽  
pp. 378-382 ◽  
Author(s):  
Jungmin Moon ◽  
Tae Yoon Lee ◽  
Hyun Jun Ahn ◽  
Tae In Lee ◽  
Wan Sik Hwang ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Charge Trap

The Effect of Trapped Charge Distributions on Data Retention Characteristics of nand Flash Memory Cells

2007 ◽  
Vol 28 (8) ◽  
pp. 750-752 ◽  
Author(s):  
M. Park ◽  
Kangdeog Suh ◽  
Keonsoo Kim ◽  
S. Hur ◽  
K. Kim ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Data Retention ◽  
Charge Distributions ◽  
Retention Characteristics ◽  
Trapped Charge

A compact drain-current model for stacked-gate flash memory cells

2000 ◽  
Vol 44 (8) ◽  
pp. 1447-1453 ◽  
Author(s):  
Sheng-Lyang Jang ◽  
Chorng-Jye Sheu ◽  
Chorng-Bin Twu
Keyword(s):  
Flash Memory ◽  
Current Model ◽  
Drain Current ◽  
Memory Cells

Quick address detection of anomalous memory cells in a flash memory test structure

1997 ◽  
Vol 10 (2) ◽  
pp. 196-200 ◽  
Author(s):  
T. Himeno ◽  
H. Hazama ◽  
T. Yaegashi ◽  
K. Sakui ◽  
K. Kanda ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Test ◽  
Test Structure ◽  
Memory Cells
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