Polysilicon resistor degradation - modeling and mechanism

Author(s):  
Sankaran Jayanarayanan
Keyword(s):  
2008 ◽  
Vol 36 (5) ◽  
pp. 2395-2403 ◽  
Author(s):  
J.-C. Mateo-Velez ◽  
V. Inguimbert ◽  
J.-F. Roussel ◽  
D. Sarrail ◽  
L. Levy ◽  
...  

2017 ◽  
Vol 2017 ◽  
pp. 1-12 ◽  
Author(s):  
Aisong Qin ◽  
Qinghua Zhang ◽  
Qin Hu ◽  
Guoxi Sun ◽  
Jun He ◽  
...  

Remaining useful life (RUL) prediction can provide early warnings of failure and has become a key component in the prognostics and health management of systems. Among the existing methods for RUL prediction, the Wiener-process-based method has attracted great attention owing to its favorable properties and flexibility in degradation modeling. However, shortcomings exist in methods of this type; for example, the degradation indicator and the first predicting time (FPT) are selected subjectively, which reduces the prediction accuracy. Toward this end, this paper proposes a new approach for predicting the RUL of rotating machinery based on an optimal degradation indictor. First, a genetic programming algorithm is proposed to construct an optimal degradation indicator using the concept of FPT. Then, a Wiener model based on the obtained optimal degradation indicator is proposed, in which the sensitivities of the dimensionless parameters are utilized to determine the FPT. Finally, the expectation of the predicted RUL is calculated based on the proposed model, and the estimated mean degradation path is explicitly derived. To demonstrate the validity of this model, several experiments on RUL prediction are conducted on rotating machinery. The experimental results indicate that the method can effectively improve the accuracy of RUL prediction.


2019 ◽  
pp. 79-106
Author(s):  
Shah Limon ◽  
Ameneh Forouzandeh Shahraki ◽  
Om Prakash Yadav

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