1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199)
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Published By IEEE

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Effects of body reverse pulse bias on geometric component of charge pumping current in FD SOI MOSFETs

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723120 ◽

2002 ◽

Cited By ~ 1

Author(s):

T.N. Duyet ◽

H. Ishikuro ◽

M. Takamiya ◽

T. Saraya ◽

T. Hiramoto

Keyword(s):

Charge Pumping ◽

Reverse Pulse

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Micro-machined dielectrically isolated (MMDI) wafer technology [SOI]

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723167 ◽

2002 ◽

Author(s):

W. Cantarini ◽

S. Lizotte ◽

S. Ahmed

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Control of the size and spatial location of voids in silicon by helium and hydrogen implantation

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723097 ◽

2002 ◽

Author(s):

B.E. Roberds ◽

A. Rudolph ◽

E.J. Whang ◽

B.S. Doyle

Keyword(s):

Spatial Location ◽

Hydrogen Implantation

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Bonding of thin films on 200 mm silicon wafers using chemical mechanical polishing

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723161 ◽

2002 ◽

Author(s):

E.C. Jones ◽

S. Tiwari ◽

K.K. Chan ◽

P.M. Solomon ◽

M. Power

Keyword(s):

Thin Films ◽

Chemical Mechanical Polishing ◽

Silicon Wafers ◽

Mechanical Polishing

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Kinetics of splitting in the Smart-Cut/sup R/ process

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723149 ◽

2002 ◽

Author(s):

B. Aspar ◽

C. Lagahe ◽

H. Moriceau ◽

A. Soubie ◽

M. Bruel ◽

...

Keyword(s):

R Process ◽

Kinetics Of

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A guide to simulation of hysteretic gate delays based on physical understanding [SOI logic]

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723141 ◽

2002 ◽

Cited By ~ 18

Author(s):

T.W. Houston ◽

S. Unnikrishnan

Keyword(s):

Physical Understanding

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Ultra-cut: a simple technique for the fabrication of SOI substrates with ultra-thin (>5 nm) silicon films

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723153 ◽

2002 ◽

Cited By ~ 2

Author(s):

K.D. Hobart ◽

F.J. Kub ◽

M.E. Twigg ◽

G.G. Jernigan ◽

P.E. Thompson

Keyword(s):

Simple Technique ◽

Silicon Films ◽

Soi Substrates

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Noncontact acoustic wave metrology of SOI substrates

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723103 ◽

2002 ◽

Author(s):

M. Banet ◽

L.P. Allen ◽

K.A. Nelson ◽

M. Fuchs ◽

J.A. Rogers ◽

...

Keyword(s):

Acoustic Wave ◽

Soi Substrates

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A 0.5-V data-storage circuit for triple-threshold MTCMOS/SIMOX LSIs

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723139 ◽

2002 ◽

Author(s):

T. Douseki ◽

M. Harada

Keyword(s):

Data Storage

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Mechanism of electron capture and its effect on trapped holes at oxygen-deficient centers in buried oxide

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) ◽

10.1109/soi.1998.723128 ◽

2002 ◽

Author(s):

S.P. Karna ◽

R.D. Pugh ◽

J.R. Chavez ◽

W. Shedd ◽

C.P. Brothers ◽

...

Keyword(s):

Electron Capture ◽

Buried Oxide

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1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Effects of body reverse pulse bias on geometric component of charge pumping current in FD SOI MOSFETs

Micro-machined dielectrically isolated (MMDI) wafer technology [SOI]

Control of the size and spatial location of voids in silicon by helium and hydrogen implantation

Bonding of thin films on 200 mm silicon wafers using chemical mechanical polishing

Kinetics of splitting in the Smart-Cut/sup R/ process

A guide to simulation of hysteretic gate delays based on physical understanding [SOI logic]

Ultra-cut: a simple technique for the fabrication of SOI substrates with ultra-thin (>5 nm) silicon films

Noncontact acoustic wave metrology of SOI substrates

A 0.5-V data-storage circuit for triple-threshold MTCMOS/SIMOX LSIs

Mechanism of electron capture and its effect on trapped holes at oxygen-deficient centers in buried oxide

1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199)
Latest Publications