Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry

2013 ◽  
pp. 629-667 ◽  
Author(s):  
Denis Cattelan ◽  
Céline Eypert ◽  
Marzouk Kloul ◽  
Mélanie Gaillet ◽  
Jean-Paul Gaston ◽  
...  
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry

scholarly journals Thin‐film hermeticity: A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry

1988 ◽  
Vol 64 (8) ◽  
pp. 4175-4180 ◽  
Author(s):  
S. Orzeszko ◽  
Bhola N. De ◽  
John A. Woollam ◽  
John J. Pouch ◽  
Samuel A. Alterovitz ◽  
...  
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Spectroscopic Ellipsometry ◽  
Variable Angle ◽  
Diamondlike Carbon ◽  
Variable Angle Spectroscopic Ellipsometry

Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

2018 ◽  
Vol 6 (39) ◽  
pp. 10450-10455 ◽  
Author(s):  
Minglin Zhao ◽  
Yujun Shi ◽  
Jun Dai ◽  
Jie Lian
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Interband Transitions ◽  
Hybrid Perovskite ◽  
Ellipsometric Study

Complex optical constants and interband transitions of a hybrid perovskite CsPbBr3 thin film measured by spectroscopic ellipsometry.

scholarly journals Parallel spectroscopic ellipsometry for ultra-fast thin film characterization

2020 ◽  
Vol 28 (7) ◽  
pp. 9288 ◽  
Author(s):  
Andrey Nazarov ◽  
Michael Ney ◽  
Ibrahim Abdulhalim
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Thin Film Characterization

Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry

2020 ◽  
Vol 110 ◽  
pp. 110445
Author(s):  
Chandan Howlader ◽  
Mehedhi Hasan ◽  
Alex Zakhidov ◽  
Maggie Yihong Chen
Keyword(s):  
Thin Film ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Spectroscopic Ellipsometry
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