GaAs Reliability 2002 Workshop
Latest Publications

TOTAL DOCUMENTS

15
(FIVE YEARS 0)

H-INDEX

2
(FIVE YEARS 0)

Published By IEEE

0790801035
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Reliability implication of InGaP HBT emitter ledge dimension

2003 ◽  
Author(s):  
E.F. Yu ◽  
D.G. Hill ◽  
C.E. Weitzel ◽  
R.D. Redd ◽  
C.S. Cook

Reliability of manufacturing 6 inch InGaP HBTs

2003 ◽  
Author(s):  
Sanghoon Cheon ◽  
Sung-Su Kim ◽  
Dae-Hyon Kim ◽  
Jae-Woo Park

Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process

2003 ◽  
Author(s):  
W.J. Rowe ◽  
B.M. Paine ◽  
A.E. Schmitz ◽  
R.H. Walden ◽  
M.J. Delaney
Keyword(s):  
Silicon Nitride ◽  
Inp Hemt

Creation of current collapse in GaN HEMTs due to short-term DC bias stress

2003 ◽  
Author(s):  
J.A. Mittereder ◽  
S.C. Binari ◽  
P.B. Klein ◽  
J.A. Roussos ◽  
D.S. Katzer ◽  
...  
Keyword(s):  
Short Term ◽  
Bias Stress ◽  
Current Collapse ◽  
Dc Bias ◽  
Gan Hemts
Load More ...
Sign in / Sign up

Export Citation Format

Share Document