Creation of current collapse in GaN HEMTs due to short-term DC bias stress
2003 ◽
Vol 50
(10)
◽
pp. 2015-2020
◽
2002 ◽
Vol 194
(2)
◽
pp. 447-451
◽
Keyword(s):
Keyword(s):
2017 ◽
Vol 73
◽
pp. 36-41
◽