2017 89th ARFTG Microwave Measurement Conference (ARFTG)
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34

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4

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Published By IEEE

9781538627471

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Mutual interference in calibration line configurations

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000823 ◽

2017 ◽

Author(s):

F.J. Schmuckle ◽

T. Probst ◽

U. Arz ◽

G.N. Phung ◽

R. Doerner ◽

...

Keyword(s):

Mutual Interference ◽

Calibration Line

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An automated fault detection program for multichannel bandwidth-limited system

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000835 ◽

2017 ◽

Author(s):

Chi Van Pham ◽

Benjamin Sawtelle ◽

Stephen Imbach ◽

Anh-Vu Pham ◽

Jironghe

Keyword(s):

Fault Detection ◽

Detection Program

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High dynamic range DC coupled CW Doppler radar for accurate respiration characterization and identification

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000828 ◽

2017 ◽

Author(s):

Ashikur Rahman ◽

Victor Lubecke ◽

Ehsan Yavari ◽

Xiaomeng Gao ◽

Olga Boric-Lubecke

Keyword(s):

Doppler Radar ◽

Dynamic Range ◽

High Dynamic Range ◽

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An accurate calibration method of microwave noise sources using noise wave de-embedding techniques

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000822 ◽

2017 ◽

Author(s):

C.-Y. Edward Tong ◽

Jake A. Connors ◽

Edward Garcia

Keyword(s):

Calibration Method ◽

Noise Sources ◽

Microwave Noise

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Coherent multi-tone stimulus-response measurements with a VNA

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000824 ◽

2017 ◽

Author(s):

Jean-Pierre Teyssier ◽

Joel Dunsmore ◽

Jan Verspecht ◽

Jim Kerr

Keyword(s):

Tone Stimulus ◽

Stimulus Response

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Quantifying the error contribution of noise parameters on Y-factor noise figure measurements

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000821 ◽

2017 ◽

Author(s):

Ken Wong ◽

Ken Wong ◽

Joe Gorin ◽

Guoquan Lu

Keyword(s):

Noise Figure ◽

Noise Parameters

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A method for improving high-insertion-loss measurements with a vector network analyzer

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000839 ◽

2017 ◽

Author(s):

Jeffrey A. Jargon ◽

Dylan F. Williams

Keyword(s):

Insertion Loss ◽

Vector Network Analyzer ◽

Network Analyzer

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Trends for computing VNA uncertainties

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000833 ◽

2017 ◽

Author(s):

David Blackham

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A new interferometric sensor for scanning near-field microwave microscopy

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000829 ◽

2017 ◽

Author(s):

Karel Hoffmann ◽

Aleksandra Baskakova

Keyword(s):

Microwave Microscopy ◽

Interferometric Sensor

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Software tools for uncertainty evaluation in VNA measurements: A comparative study

2017 89th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2017.8000820 ◽

2017 ◽

Author(s):

G. Avolio ◽

D. F. Williams ◽

S. Streett ◽

M. Frey ◽

D. Schreurs ◽

...

Keyword(s):

Comparative Study ◽

Software Tools ◽

Uncertainty Evaluation

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