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Optical Measurement Systems for Industrial Inspection XII
Latest Publications
TOTAL DOCUMENTS
67
(FIVE YEARS 67)
H-INDEX
0
(FIVE YEARS 0)
Published By SPIE
9781510643987, 9781510643994
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Front Matter: Volume 11782
Optical Measurement Systems for Industrial Inspection XII
◽
10.1117/12.2603216
◽
2021
◽
Keyword(s):
Matter Volume
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Optical sociology: how organizational culture impacts advances in optical metrology
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2596985
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2021
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Author(s):
Peter J. de Groot
Keyword(s):
Organizational Culture
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Optical Metrology
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Three-dimensional measurement using a shape from focus method applied on a context of structured light profilometry
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2592331
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2021
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Author(s):
Xiangjun Kong
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Erwan Dupont
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Al Hajjar Hani
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Frédéric Lamarque
Keyword(s):
Structured Light
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Three Dimensional
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Dimensional Measurement
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Three Dimensional Measurement
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Shape From Focus
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Analysis of resolution enhancement through microsphere-assisted interferometry in the 3D spatial frequency domain
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2593296
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2021
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Author(s):
Lucie Hueser
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Peter Lehmann
Keyword(s):
Spatial Frequency
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Frequency Domain
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Resolution Enhancement
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Spatial Frequency Domain
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Analyzing real-time capability of raw laser-Doppler vibrometer signal combination for signal diversity
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2592048
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2021
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Author(s):
Marvin Schewe
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Christian Rembe
Keyword(s):
Real Time
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Laser Doppler Vibrometer
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Laser Doppler
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Signal Combination
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Signal Diversity
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Recognition of small areas of activity by the pointwise intensity-based dynamic speckle analysis
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2592600
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2021
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Author(s):
Elena V. Stoykova
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Nataliya Berberova
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Blaga Blagoeva
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Dimana Nazarova
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Lian Nedelchev
◽
...
Keyword(s):
Small Areas
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Dynamic Speckle
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Holographic fingerprint as a morphological marker to identify micro-plastics
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2593832
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2021
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Author(s):
Vittorio Bianco
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Pasquale Memmolo
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Daniele Pirone
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Pierluigi Carcagnì
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Francesco Merola
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...
Keyword(s):
Morphological Marker
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Intelligent quality monitoring for additive manufactured surfaces by machine learning and light scattering
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2592554
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2021
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Author(s):
Mingyu Liu
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Nicola Senin
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Richard Leach
Keyword(s):
Machine Learning
◽
Light Scattering
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Quality Monitoring
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Local spectroscopic characterization of materials using coherence scanning interferometry
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2593011
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2021
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Author(s):
Paul C. Montgomery
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Sébastien Marbach
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Rémy Claveau
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Manuel Flury
Keyword(s):
Spectroscopic Characterization
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Characterization Of Materials
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Speckle simulation tool for the design of laser-based displacement sensors
Optical Measurement Systems for Industrial Inspection XII
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10.1117/12.2592596
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2021
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Author(s):
Ernst Csencsics
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Tobias Wolf
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Georg Schitter
Keyword(s):
Simulation Tool
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Displacement Sensors
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