2016 87th ARFTG Microwave Measurement Conference (ARFTG)
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9781509013081
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Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure

2016 ◽  
Author(s):  
Gianni Bosi ◽  
Antonio Raffo ◽  
Gustavo Avolio ◽  
Dominique Schreurs ◽  
David A. Humphreys
Keyword(s):  
Measurement Uncertainty ◽  
Microwave Measurement ◽  
Nonlinear Embedding

Supply-terminal 40 MHz BW characterization of impedance-like nonlinear functions for envelope tracking PAs

2016 ◽  
Author(s):  
Gian Piero Gibiino ◽  
Julien Couvidat ◽  
Gustavo Avolio ◽  
Dominique Schreurs ◽  
Alberto Santarelli
Keyword(s):  
Nonlinear Functions ◽  
Envelope Tracking

Traceable calibration with 1.0mm coaxial standards

2016 ◽  
Author(s):  
J. Hoffmann ◽  
M. Wollensack ◽  
J. Ruefenacht ◽  
D. Stalder ◽  
M. Zeier
Keyword(s):  
Traceable Calibration

Verification of a foundry-developed transistor model including measurement uncertainty

2016 ◽  
Author(s):  
Dylan Williams ◽  
Wei Zhao ◽  
Richard A. Chamberlin ◽  
Jerome Cheron ◽  
Miguel Urteaga
Keyword(s):  
Measurement Uncertainty ◽  
Transistor Model

Importance and measurement of phase-stiffness in RF switching amplifiers

2016 ◽  
Author(s):  
Dubravko Babic ◽  
Earl McCune ◽  
Waclaw Godycki ◽  
Quentin Diduck ◽  
Douglas Kirkpatrick
Keyword(s):  
Switching Amplifiers
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