2008 9th International Conference on Ultimate Integration of Silicon
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53
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6
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Published By IEEE

9781424417292
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Anomalous Ge diffusion effects during Ge-condensation

2008 ◽  
Author(s):  
C.S. Beer ◽  
T.E. Whall ◽  
R.J.H. Morris ◽  
E.H.C. Parker ◽  
D.R. Leadley
Keyword(s):  
Diffusion Effects

Channel backscattering characteristics of high performance germanium pMOSFETs

2008 ◽  
Author(s):  
A. Dobbie ◽  
B. De Jaeger ◽  
M. Meuris ◽  
T.E. Whall ◽  
E.H.C. Parker ◽  
...  
Keyword(s):  
High Performance

Back-Scattering in Quasi Ballistic NanoMOSFETs: The role of non thermal carrier distributions

2008 ◽  
Author(s):  
R. Clerc ◽  
P. Palestri ◽  
L. Selmi ◽  
G. Ghibaudo
Keyword(s):  
Back Scattering

Variability in SOI Schottky barrier MOSFETs

2008 ◽  
Author(s):  
S.F. Feste ◽  
M. Zhang ◽  
J. Knoch ◽  
S.-L. Zhang ◽  
S. Mantl
Keyword(s):  
Schottky Barrier

Role of Si implantation in control of underlap length in Schottky-barrier source/drain MOSFETs on ultrathin body SOI

2008 ◽  
Author(s):  
Z. J. Qiu ◽  
Z. Zhang ◽  
J. Olsson ◽  
J. Lu ◽  
P.-E. Hellstrom ◽  
...  
Keyword(s):  
Schottky Barrier

scholarly journals Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes

2008 ◽  
Author(s):  
B. Rajasekharan ◽  
C. Salm ◽  
R.J.E. Hueting ◽  
T. Hoang ◽  
J. Schmitz
Keyword(s):  
Transport Properties ◽  
Scaling Effects ◽  
Dimensional Scaling

A model for MOS gate stack quality evaluation based on the gate current 1/f noise

2008 ◽  
Author(s):  
P. Magnone ◽  
F. Crupi ◽  
G. Iannaccone ◽  
G. Giusi ◽  
C. Pace ◽  
...  
Keyword(s):  
Quality Evaluation ◽  
Gate Stack ◽  
Gate Current ◽  
Mos Gate

A new Multi Subband Monte Carlo simulator for nano p-MOSFETs

2008 ◽  
Author(s):  
M. De Michielis ◽  
D. Esseni ◽  
P. Palestri ◽  
L. Selmi
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulator
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