ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)

Direct parameter extraction techniques for a new poly-Si TFT model

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766247 ◽

2003 ◽

Author(s):

B. Iniguez ◽

Z. Xu ◽

T. Fjeldly ◽

M.S. Shur

Keyword(s):

Parameter Extraction ◽

Extraction Techniques

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A high density matched hexagonal transistor structure in standard CMOS technology for high speed applications

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766245 ◽

2003 ◽

Cited By ~ 3

Author(s):

A. Van den Bosch ◽

M. Steyaert ◽

W. Sansen

Keyword(s):

High Speed ◽

Cmos Technology ◽

High Density ◽

Transistor Structure

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A new test structure for direct extraction of SPICE model parameters for double polysilicon bipolar transistors

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766211 ◽

2003 ◽

Cited By ~ 1

Author(s):

M. Sanden ◽

Shi-Li Zhang ◽

J.V. Grahn ◽

M. Ostling

Keyword(s):

Bipolar Transistors ◽

Test Structure ◽

Model Parameters ◽

Direct Extraction ◽

Spice Model

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Identification of MOS oxide defect location with a spatial resolution less than 0.1 μm using photoemission microscope

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766222 ◽

2003 ◽

Author(s):

T. Ohzone ◽

M. Yuzaki ◽

T. Matsuda ◽

E. Kameda

Keyword(s):

Spatial Resolution ◽

Defect Location

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A special test structure for the measurement of the injection dependent series resistance of power diodes

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766220 ◽

2003 ◽

Author(s):

S. Bellone ◽

S. Daliento ◽

A. Sanseverino

Keyword(s):

Series Resistance ◽

Test Structure ◽

Special Test ◽

Power Diodes ◽

Dependent Series

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Identification of plasma induced damage conditions in VLSI designs

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766206 ◽

2003 ◽

Cited By ~ 3

Author(s):

P. Simon ◽

W. Maly

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Comparison of sheet-resistance measurements obtained by standard and small-area four-point probing

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766217 ◽

2003 ◽

Cited By ~ 2

Author(s):

N.M.P. Guillaume ◽

M.W. Cresswell ◽

R.A. Allen ◽

S. Everist ◽

L.W. Linholm

Keyword(s):

Sheet Resistance ◽

Small Area

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A simple physical extraction method for R/sub D/-R/sub S/ of asymmetric MOSFETs

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766232 ◽

2003 ◽

Cited By ~ 1

Author(s):

A. Blaum ◽

J. Victory ◽

C.C. McAndrew

Keyword(s):

Extraction Method

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Substrate resistance effect on the Fmax parameter of isolated BJT in BiCMOS process

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766210 ◽

2003 ◽

Cited By ~ 6

Author(s):

D. Gloria ◽

A. Perrotin ◽

J.L. Carbonero ◽

G. Morin

Keyword(s):

Bicmos Process ◽

Substrate Resistance

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Evaluation of test methods and associated test structures for interconnect reliability control

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) ◽

10.1109/icmts.1999.766237 ◽

2003 ◽

Cited By ~ 2

Author(s):

S. Foley ◽

J. Molyneaux ◽

A. Mathewson

Keyword(s):

Test Methods ◽

Interconnect Reliability ◽

Reliability Control

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ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Direct parameter extraction techniques for a new poly-Si TFT model

A high density matched hexagonal transistor structure in standard CMOS technology for high speed applications

A new test structure for direct extraction of SPICE model parameters for double polysilicon bipolar transistors

Identification of MOS oxide defect location with a spatial resolution less than 0.1 μm using photoemission microscope

A special test structure for the measurement of the injection dependent series resistance of power diodes

Identification of plasma induced damage conditions in VLSI designs

Comparison of sheet-resistance measurements obtained by standard and small-area four-point probing

A simple physical extraction method for R/sub D/-R/sub S/ of asymmetric MOSFETs

Substrate resistance effect on the Fmax parameter of isolated BJT in BiCMOS process

Evaluation of test methods and associated test structures for interconnect reliability control

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ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Direct parameter extraction techniques for a new poly-Si TFT model

A high density matched hexagonal transistor structure in standard CMOS technology for high speed applications

A new test structure for direct extraction of SPICE model parameters for double polysilicon bipolar transistors

Identification of MOS oxide defect location with a spatial resolution less than 0.1 μm using photoemission microscope

A special test structure for the measurement of the injection dependent series resistance of power diodes

Identification of plasma induced damage conditions in VLSI designs

Comparison of sheet-resistance measurements obtained by standard and small-area four-point probing

A simple physical extraction method for R/sub D/-R/sub S/ of asymmetric MOSFETs

Substrate resistance effect on the Fmax parameter of isolated BJT in BiCMOS process

Evaluation of test methods and associated test structures for interconnect reliability control

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)
Latest Publications