2019 IEEE European Test Symposium (ETS)
Latest Publications

TOTAL DOCUMENTS

50
(FIVE YEARS 0)

H-INDEX

3
(FIVE YEARS 0)

Published By IEEE

9781728111735
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

scholarly journals Preliminary 3

2019 ◽  

STAHL: A Novel Scan-Test-Aware Hardened Latch Design

2019 ◽  
Author(s):  
Ruijun Ma ◽  
Stefan Holst ◽  
Xiaoqing Wen ◽  
Aibin Yan ◽  
Hui Xu
Keyword(s):  
Scan Test

A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip

2019 ◽  
Author(s):  
A. Manzini ◽  
P. Inglese ◽  
L. Caldi ◽  
R. Cantero ◽  
G. Carnevale ◽  
...  
Keyword(s):  
Machine Learning ◽  
Flash Memories ◽  
Automotive Systems ◽  
Systems On Chip ◽  
On Chip ◽  
Embedded Flash

Revisiting Logic Locking for Reversible Computing

2019 ◽  
Author(s):  
Nimisha Limaye ◽  
Muhammad Yasin ◽  
Ozgur Sinanoglu
Keyword(s):  
Reversible Computing ◽  
Logic Locking

scholarly journals Foreword

2019 ◽  

LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology

2019 ◽  
Author(s):  
Soumya Mittal ◽  
R.D. Blanton
Keyword(s):  
Defect Diagnosis

Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution

2019 ◽  
Author(s):  
Yu Huang ◽  
Jakub Janicki ◽  
Szczepan Urban
Keyword(s):  
Scan Chain ◽  
Diagnostic Resolution ◽  
Adaptive Pattern

Model-driven AMS Test Setup Validation Tool prepared for IEEE P1687.2

2019 ◽  
Author(s):  
Leon M. A. van de Logt ◽  
Vladimir A. Zivkovic ◽  
Ingrid H. A. van Baast
Keyword(s):  
Test Setup ◽  
Model Driven ◽  
Validation Tool

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection

2019 ◽  
Author(s):  
Mehmet Ince ◽  
Ender Yilmaz ◽  
Wei Fu ◽  
Joonsung Park ◽  
Krishnaswamy Nagaraj ◽  
...  
Keyword(s):  
Fault Detection ◽  
Self Test ◽  
Built In Self Test

scholarly journals Preliminary 2

2019 ◽  
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