International Conference on Microelectronic Test Structures, 2003.
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45

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8

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0780376536

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An improved SPICE model for ferroelectric liquid crystal microdisplays

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197438 ◽

2003 ◽

Author(s):

S. Smith ◽

A.J. Walton ◽

I. Underwood ◽

C. Miremont ◽

D.G. Vass ◽

...

Keyword(s):

Liquid Crystal ◽

Ferroelectric Liquid Crystal ◽

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New evaluation method for reliability of poly-Si thin film transistors using pico-second time-resolved emission microscope

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197457 ◽

2003 ◽

Author(s):

Y. Uraoka ◽

N. Hirai ◽

H. Yano ◽

T. Hatayama ◽

T. Fuyuki

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Evaluation Method ◽

Time Resolved ◽

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Test time reduction methods for yield test structures

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197384 ◽

2003 ◽

Author(s):

C. Hess ◽

H. Read ◽

J. Ren ◽

L.H. Weiland ◽

Jianjun Cheng ◽

...

Keyword(s):

Test Time ◽

Test Time Reduction ◽

Reduction Methods ◽

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Design and integration of electrical-based dimensional process-window checking infrastructure

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197423 ◽

2003 ◽

Author(s):

K.Y.Y. Doong ◽

R.C.J. Wang ◽

J.C.H. Huang ◽

S.C. Lin ◽

L.J. Hung ◽

...

Keyword(s):

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Characterization and modeling of MOSFET mismatch of a deep submicron technology

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197468 ◽

2003 ◽

Author(s):

M. Quarantelli ◽

S. Saxena ◽

N. Dragone ◽

J.A. Babcock ◽

C. Hess ◽

...

Keyword(s):

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The negative capacitance effect on the C-V measurement of ultra thin gate dielectrics induced by the stray capacitance of the measurement system

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197461 ◽

2003 ◽

Author(s):

Y. Okawa ◽

H. Norimatsu ◽

H. Suto ◽

M. Takayanagi

Keyword(s):

Measurement System ◽

Gate Dielectrics ◽

Negative Capacitance ◽

Stray Capacitance ◽

Capacitance Effect

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Study on STI mechanical stress induced variations on advanced CMOSFETs

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197462 ◽

2003 ◽

Author(s):

Y.M. Sheu ◽

K.Y.Y. Doong ◽

C.H. Lee ◽

M.J. Chen ◽

C.H. Diaz

Keyword(s):

Mechanical Stress

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A hybrid table/analytical approach to MOSFET modelling

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197435 ◽

2003 ◽

Author(s):

V. Bourenkov ◽

K.G. McCarthy ◽

A. Mathewson

Keyword(s):

Analytical Approach

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Current mirror test structures for studying adjacent layout effects on systematic transistor mismatch

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197465 ◽

2003 ◽

Author(s):

H.P. Tuinhout ◽

A. Bretveld ◽

W.C.M. Peters

Keyword(s):

Current Mirror ◽

Transistor Mismatch

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Scalable ground-shielded open fixture applied to de-embedding techniques

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197406 ◽

2003 ◽

Author(s):

T. Kaija ◽

E. Ristolainen

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