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2013 14th Latin American Test Workshop - LATW
Latest Publications
TOTAL DOCUMENTS
38
(FIVE YEARS 0)
H-INDEX
5
(FIVE YEARS 0)
Published By IEEE
9781479905973, 9781479905959, 9781479905966
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Latest Documents
Most Cited Documents
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Low cost signal reconstruction based testing of RF components using incoherent undersampling
2013 14th Latin American Test Workshop - LATW
◽
10.1109/latw.2013.6562670
◽
2013
◽
Cited By ~ 1
Author(s):
Debesh Bhatta
◽
Aritra Banerjee
◽
Sabyasachi Deyati
◽
Nicholas Tzou
◽
Abhijit Chatterjee
Keyword(s):
Low Cost
◽
Signal Reconstruction
◽
Rf Components
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Memristor-based filtering applications
2013 14th Latin American Test Workshop - LATW
◽
10.1109/latw.2013.6562672
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2013
◽
Cited By ~ 27
Author(s):
Alon Ascoli
◽
R. Tetzlaff
◽
Fernando Corinto
◽
Miroslav Mirchev
◽
Marco Gilli
Download Full-text
Fast fault injection techniques using FPGAs
2013 14th Latin American Test Workshop - LATW
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10.1109/latw.2013.6562680
◽
2013
◽
Cited By ~ 2
Author(s):
Luis Entrena
Keyword(s):
Fault Injection
◽
Injection Techniques
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ISA configurability of an FPGA test-processor used for board-level interconnection testing
2013 14th Latin American Test Workshop - LATW
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10.1109/latw.2013.6562678
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2013
◽
Cited By ~ 1
Author(s):
J.-H. Meza Escobar
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J. Sachsse
◽
S. Ostendorff
◽
H.-D. Wuttke
Keyword(s):
Board Level
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Predicting die-level process variations from wafer test data for analog devices: A feasibility study
2013 14th Latin American Test Workshop - LATW
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10.1109/latw.2013.6562658
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2013
◽
Cited By ~ 2
Author(s):
S. Devarakond
◽
J. McCoy
◽
A. Nahar
◽
J.M. Carulli
◽
S. Bhattacharya
◽
...
Keyword(s):
Feasibility Study
◽
Test Data
◽
Process Variations
◽
Wafer Test
◽
Level Process
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Towards an automatic generation of diagnostic in-field SBST for processor components
2013 14th Latin American Test Workshop - LATW
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10.1109/latw.2013.6562676
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2013
◽
Cited By ~ 5
Author(s):
Mario Scholzel
◽
Tobias Koal
◽
Stephanie Roder
◽
Heinrich Theodor Vierhaus
Keyword(s):
Automatic Generation
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Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam
2013 14th Latin American Test Workshop - LATW
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10.1109/latw.2013.6562682
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2013
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Cited By ~ 5
Author(s):
Santiago Sondon
◽
Alfredo Falcon
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Pablo Mandolesi
◽
Pedro Julian
◽
Nahuel Vega
◽
...
Keyword(s):
Heavy Ion
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Single Event
◽
Single Event Effects
◽
Radiation Induced
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Effect of aging on power integrity of digital integrated circuits
2013 14th Latin American Test Workshop - LATW
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10.1109/latw.2013.6562681
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2013
◽
Cited By ~ 4
Author(s):
A. Boyer
◽
S. Ben Dhia
Keyword(s):
Integrated Circuits
◽
Power Integrity
◽
Digital Integrated Circuits
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Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs
2013 14th Latin American Test Workshop - LATW
◽
10.1109/latw.2013.6562661
◽
2013
◽
Cited By ~ 2
Author(s):
Arwa Ben Dhia
◽
Lirida Naviner
◽
Philippe Matherat
Keyword(s):
Fault Tolerant
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[Copyright notice]
2013 14th Latin American Test Workshop - LATW
◽
10.1109/latw.2013.6562654
◽
2013
◽
Keyword(s):
Copyright Notice
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