Effect of aging on power integrity of digital integrated circuits

2013 14th Latin American Test Workshop - LATW ◽

10.1109/latw.2013.6562681 ◽

2013 ◽

Author(s):

A. Boyer ◽

S. Ben Dhia

Keyword(s):

Integrated Circuits ◽

Power Integrity ◽

Digital Integrated Circuits

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Effect of electrical stresses on digital integrated circuits power integrity

2013 17th IEEE Workshop on Signal and Power Integrity ◽

10.1109/sapiw.2013.6558327 ◽

2013 ◽

Author(s):

A. Boyer ◽

S. Ben Dhia

Keyword(s):

Integrated Circuits ◽

Power Integrity ◽

Digital Integrated Circuits

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Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits

Journal of Low Power Electronics ◽

10.1166/jolpe.2014.1307 ◽

2014 ◽

Vol 10 (1) ◽

pp. 165-172 ◽

Author(s):

A. Boyer ◽

S. Ben Dhia

Keyword(s):

Integrated Circuits ◽

Power Integrity ◽

Digital Integrated Circuits ◽

Conducted Emission

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Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) ◽

10.1109/emccompo.2013.6735199 ◽

2013 ◽

Author(s):

A. Boyer ◽

S. Ben Dhia

Keyword(s):

Integrated Circuits ◽

Power Integrity ◽

Digital Integrated Circuits ◽

Conducted Emission

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Measurement of digital integrated circuits thermal resistance on change of frequency of ring generator

Izmeritel`naya Tekhnika ◽

10.32446/0368-1025it.2018-2-46-50 ◽

2018 ◽

pp. 46-50

Author(s):

V. A. Sergeyev ◽

Ya. G. Teten’kin

Keyword(s):

Integrated Circuits ◽

Thermal Resistance ◽

Digital Integrated Circuits

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Rules for the preparation of detail specifications for digital integrated circuits of assessed quality. Full assessment level

10.3403/00146395u ◽

2015 ◽

Keyword(s):

Integrated Circuits ◽

Digital Integrated Circuits

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Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB

10.3403/00146880u ◽

2015 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Electronic Components ◽

Digital Integrated Circuits

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Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB

10.3403/00146880 ◽

1981 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Electronic Components ◽

Digital Integrated Circuits

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Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories

10.3403/00542694u ◽

2015 ◽

Keyword(s):

Integrated Circuits ◽

Quality Assessment ◽

Integrated Circuit ◽

Semiconductor Devices ◽

Electronic Components ◽

Digital Integrated Circuits

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Semiconductor devices. Integrated circuits. Digital integrated circuits

10.3403/02271223 ◽

2001 ◽

Keyword(s):

Integrated Circuits ◽

Semiconductor Devices ◽

Digital Integrated Circuits

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Quasi-TEM spectral domain analysis of thick microstrip for microwave and digital integrated circuits

Electronics Letters ◽

10.1049/el:19890840 ◽

1989 ◽

Vol 25 (18) ◽

pp. 1253 ◽

Author(s):

V.K. Tripathi ◽

R.T. Kollipara ◽

L.A. Hayden

Keyword(s):

Integrated Circuits ◽

Domain Analysis ◽

Spectral Domain ◽

Digital Integrated Circuits

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