Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94
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Analysis of externally imposed mechanical stress effects on the hot-carrier-induced degradation of MOSFET's

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307861 ◽

1994 ◽

Cited By ~ 7

Author(s):

R. Degraeve ◽

I. De Wolf ◽

G. Groeseneken ◽

H.E. Maes

Keyword(s):

Mechanical Stress ◽

Hot Carrier ◽

Stress Effects

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Field and temperature acceleration of time-dependent dielectric breakdown in intrinsic thin SiO/sub 2/

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307847 ◽

1994 ◽

Cited By ~ 39

Author(s):

J.S. Suehle ◽

P. Chaparala ◽

C. Messick ◽

W.M. Miller ◽

K.C. Boyko

Keyword(s):

Dielectric Breakdown ◽

Time Dependent ◽

Time Dependent Dielectric Breakdown

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Effects of temperature and defects on breakdown lifetime of thin SiO/sub 2/ at very low voltages

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307846 ◽

1994 ◽

Cited By ~ 11

Author(s):

K.F. Schuegraf ◽

Chenming Hu

Keyword(s):

Effects Of Temperature

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Long term charge loss in EPROMs with ONO interpoly dielectric

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307811 ◽

1994 ◽

Cited By ~ 3

Author(s):

M.R. Hermann ◽

M. Ciappa ◽

A. Schenk

Keyword(s):

Charge Loss

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Influence of BiCMOS processing steps on thin gate oxide quality

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307830 ◽

1994 ◽

Cited By ~ 2

Author(s):

S. Whiston ◽

B. Stakelum ◽

M. O'Neill ◽

W. Lane

Keyword(s):

Gate Oxide ◽

Thin Gate Oxide ◽

Processing Steps

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Electromigration reliability improvement of W-plug vias by titanium layering

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307840 ◽

1994 ◽

Cited By ~ 15

Author(s):

C.D. Graas ◽

H.A. Le ◽

J.W. McPherson ◽

R.H. Havemann

Keyword(s):

Reliability Improvement

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