time dependent dielectric breakdown
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scholarly journals ACCOUNTING OF THE POROSITY OF THE MATERIAL IN THE SIMULATION OF THE TIME-DEPENDENT DIELECTRIC BREAKDOWN IN THE METALLIZATION SYSTEM OF INTEGRATED CIRCUITS

2021 ◽  
Author(s):  
Andrey Orlov ◽  
Ekaterina Ganykina ◽  
Askar Rezvanov
Keyword(s):  
Integrated Circuits ◽  
Simulation Modeling ◽  
Dielectric Breakdown ◽  
Copper Ions ◽  
Time Dependent ◽  
Time Dependent Dielectric Breakdown ◽  
Low K

In this work, simulation modeling of processes of the diffusion of copper ions in low-k dielectric between two neighboring copper lines is performed

Understanding the Initial Stages of Time Dependent Dielectric Breakdown in Si/SiO2 MOSFETs Utilizing EDMR and NZFMR

2021 ◽  
Author(s):  
Fedor V. Sharov ◽  
Stephen. J. Moxim ◽  
Patrick M. Lenahan ◽  
David R. Hughart ◽  
Gaddi S. Haase ◽  
...  
Keyword(s):  
Dielectric Breakdown ◽  
Time Dependent ◽  
Time Dependent Dielectric Breakdown

Electrical overstress effect characterization on Power MOS Trenchfet and correlation with time dependent dielectric breakdown

2021 ◽  
Vol 125 ◽  
pp. 114351
Author(s):  
B. Mazza ◽  
S. Patanè ◽  
F. Cordiano ◽  
M. Giliberto ◽  
G. Barletta ◽  
...  
Keyword(s):  
Dielectric Breakdown ◽  
Time Dependent ◽  
Time Dependent Dielectric Breakdown ◽  
Electrical Overstress

Constant-current time dependent dielectric breakdown in thick amorphous SiO2 capacitors

2021 ◽  
Author(s):  
Federico Giuliano ◽  
Susanna Reggiani ◽  
Elena Gnani ◽  
Antonio Gnudi ◽  
Mattia Rossetti ◽  
...  
Keyword(s):  
Dielectric Breakdown ◽  
Time Dependent ◽  
Constant Current ◽  
Amorphous Sio2 ◽  
Current Time ◽  
Time Dependent Dielectric Breakdown

Time-dependent dielectric breakdown of gate oxide on 4H-SiC with different oxidation processes

2021 ◽  
Vol 123 ◽  
pp. 114186
Author(s):  
Bing-Yue Tsui ◽  
Yi-Ting Huang ◽  
Tian-Li Wu ◽  
Chao-Hsin Chien
Keyword(s):  
Dielectric Breakdown ◽  
Gate Oxide ◽  
Time Dependent ◽  
Oxidation Processes ◽  
Time Dependent Dielectric Breakdown

Noise Analysis of the Leakage Current in Time-Dependent Dielectric Breakdown in a GaN SLCFET

2021 ◽  
Vol 68 (5) ◽  
pp. 2220-2225
Author(s):  
Stefano Dalcanale ◽  
Michael J. Uren ◽  
Josephine Chang ◽  
Ken Nagamatsu ◽  
Justin A. Parke ◽  
...  
Keyword(s):  
Leakage Current ◽  
Dielectric Breakdown ◽  
Noise Analysis ◽  
Time Dependent ◽  
Time Dependent Dielectric Breakdown

scholarly journals Time-Dependent Dielectric Breakdown of Commercial 1.2 kV 4H-SiC Power MOSFETs

2021 ◽  
pp. 1-1
Author(s):  
Tianshi Liu ◽  
Shengnan Zhu ◽  
Marvin H. White ◽  
Arash Salemi ◽  
David Sheridan ◽  
...  
Keyword(s):  
Dielectric Breakdown ◽  
Time Dependent ◽  
Power Mosfets ◽  
Time Dependent Dielectric Breakdown
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