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2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
Latest Publications
TOTAL DOCUMENTS
44
(FIVE YEARS 0)
H-INDEX
6
(FIVE YEARS 0)
Published By IEEE
9781467379052
Latest Documents
Most Cited Documents
Contributed Authors
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Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
An Hybrid Architecture for consolidating mixed criticality applications on multicore systems
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229823
◽
2015
◽
Cited By ~ 11
Author(s):
Serhiy Avramenko
◽
Stefano Esposito
◽
Massimo Violante
◽
Marco Sozzi
◽
Massimo Traversone
◽
...
Keyword(s):
Hybrid Architecture
◽
Multicore Systems
◽
Mixed Criticality
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Timing-resilient Network-on-Chip architectures
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229836
◽
2015
◽
Cited By ~ 1
Author(s):
Alexandros Panteloukas
◽
Anastasios Psarras
◽
Chrysostomos Nicopoulos
◽
Giorgos Dimitrakopoulos
Keyword(s):
Network On Chip
◽
On Chip
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Low-power memory repair for high defect densities
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229853
◽
2015
◽
Cited By ~ 2
Author(s):
Panagiota Papavramidou
◽
Michael Nicolaidis
Keyword(s):
Low Power
◽
Defect Densities
◽
High Defect Densities
◽
Memory Repair
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Adaptive healing procedure for lifetime improvement in Wireless Sensor Networks
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229833
◽
2015
◽
Cited By ~ 1
Author(s):
Diane Tchuani Tchakonte
◽
Emmanuel Simeu
◽
Maurice Tchuente
Keyword(s):
Wireless Sensor Networks
◽
Sensor Networks
◽
Wireless Sensor
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Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229820
◽
2015
◽
Cited By ~ 6
Author(s):
Marc Lacruche
◽
Nicolas Borrel
◽
Clement Champeix
◽
Cyril Roscian
◽
Alexandre Sarafianos
◽
...
Keyword(s):
Fault Injection
◽
Nanosecond Pulses
◽
Laser Fault Injection
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A call for cross-layer and cross-domain reliability analysis and management
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229821
◽
2015
◽
Author(s):
Dan Alexandrescu
◽
Adrian Evans
◽
Enrico Costenaro
◽
Maximilien Glorieux
Keyword(s):
Reliability Analysis
◽
Cross Layer
◽
Cross Domain
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Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229849
◽
2015
◽
Cited By ~ 7
Author(s):
Clement Champeix
◽
Nicolas Borrel
◽
Jean-Max Dutertre
◽
Bruno Robisson
◽
Mathieu Lisart
◽
...
Keyword(s):
Experimental Validation
◽
Current Sensor
◽
Induced Currents
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Towards Trojan circuit detection with maximum state transition exploration
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229831
◽
2015
◽
Cited By ~ 1
Author(s):
Joseph Lenox
◽
Spyros Tragoudas
Keyword(s):
State Transition
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An effective embedded test & diagnosis solution for external memories
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229852
◽
2015
◽
Cited By ~ 3
Author(s):
G. Harutyunyan
◽
Y. Zorian
Keyword(s):
Embedded Test
Download Full-text
Real-time on-chip supply voltage sensor and its application to trace-based timing error localization
2015 IEEE 21st International On-Line Testing Symposium (IOLTS)
◽
10.1109/iolts.2015.7229857
◽
2015
◽
Cited By ~ 7
Author(s):
Miho Ueno
◽
Masanori Hashimoto
◽
Takao Onoye
Keyword(s):
Real Time
◽
Supply Voltage
◽
Voltage Sensor
◽
Timing Error
◽
Error Localization
◽
On Chip
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