Integrated Circuit Test Engineering
Latest Publications

TOTAL DOCUMENTS

12

(FIVE YEARS 0)

H-INDEX

1

(FIVE YEARS 0)

Published By Springer-Verlag

1846280230

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Test Pattern Generation and Fault Simulation

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_10 ◽

2005 ◽

pp. 235-255

Keyword(s):

Test Pattern ◽

Fault Simulation ◽

Pattern Generation ◽

Test Pattern Generation

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Digital Logic Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_3 ◽

2005 ◽

pp. 41-93 ◽

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Design for Testability — Structured Test Approaches

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_8 ◽

2005 ◽

pp. 197-223

Keyword(s):

Design For Testability ◽

Structured Test

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Memory Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_4 ◽

2005 ◽

pp. 95-121

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Test Economics

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_12 ◽

2005 ◽

pp. 267-274

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Introduction to Integrated Circuit Test Engineering

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_1 ◽

2005 ◽

pp. 1-16 ◽

Keyword(s):

Integrated Circuit

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Input-Output Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_7 ◽

2005 ◽

pp. 175-196

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Mixed-Signal Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_6 ◽

2005 ◽

pp. 143-173

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System on a Chip (SoC) Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_9 ◽

2005 ◽

pp. 225-234

Keyword(s):

Soc Test ◽

System On A Chip

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Analogue Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_5 ◽

2005 ◽

pp. 123-142

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