Test Economics

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_12 ◽

2005 ◽

pp. 267-274

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Test economics in the 2lst Century

IEEE Design & Test of Computers ◽

10.1109/54.605993 ◽

1997 ◽

Vol 14 (3) ◽

pp. 41-44 ◽

Author(s):

J. Turino

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Design And Test Economics - an Extra Dimension

IEEE Design & Test of Computers ◽

10.1109/mdt.1997.605986 ◽

1997 ◽

Vol 14 (3) ◽

pp. 15-16 ◽

Author(s):

T. Ambler ◽

M. Abadir

Keyword(s):

Extra Dimension ◽

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Special issue on test economics

Journal of Electronic Testing ◽

10.1007/bf00134737 ◽

1992 ◽

Vol 3 (3) ◽

pp. 281-281

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Special Issue ◽

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A model for cost analysis–application to clinical laboratory test economics using computer facilities

Journal of Automatic Chemistry ◽

10.1155/s1463924686000354 ◽

1986 ◽

Vol 8 (4) ◽

pp. 178-185 ◽

Author(s):

F. R. Hindriks ◽

W. van der Slik ◽

A. Bosman ◽

Chr. Frowein ◽

H. Kamps

Keyword(s):

Cost Analysis ◽

Laboratory Test ◽

Clinical Laboratory ◽

Test Economics ◽

Clinical Laboratory Test ◽

Analysis Application

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Integrated test solutions and test economics for MCMs

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529833 ◽

2002 ◽

Author(s):

K.T. Kornegay ◽

K. Roy

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Applications of semiconductor test economics, and multisite testing to lower cost of test

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805620 ◽

2003 ◽

Author(s):

A.C. Evans

Keyword(s):

Semiconductor Test ◽

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Test Economics

WSPC Series in Advanced Integration and Packaging - Cost Analysis of Electronic Systems ◽

10.1142/9789813148260_0007 ◽

2016 ◽

pp. 113-154

Author(s):

Peter Sandborn

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Behavioral Test Economics

2006 IEEE International Test Conference ◽

10.1109/test.2006.297651 ◽

2006 ◽

Author(s):

Scott Davidson ◽

Anthony Ambler ◽

Helen Davidson

Keyword(s):

Behavioral Test ◽

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Test Economics and Product Quality

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_3 ◽

2002 ◽

pp. 35-55

Keyword(s):

Product Quality ◽

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Structured test methodologies and test economics for multichip modules

IEEE Transactions on Components Packaging and Manufacturing Technology Part B ◽

10.1109/96.486503 ◽

1996 ◽

Vol 19 (1) ◽

pp. 195-202 ◽

Author(s):

K.T. Kornegay ◽

K. Roy

Keyword(s):

Multichip Modules ◽

Test Economics ◽

Structured Test

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