2020 94th ARFTG Microwave Measurement Symposium (ARFTG)
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22
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Published By IEEE

9781728120560
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Device Noise Parameters Characterization: Towards Extraction Automation.

2020 ◽  
Author(s):  
Luciano Boglione ◽  
Jason Roussos ◽  
Alina Caddemi ◽  
Emanuele Cardillo ◽  
Giovanni Crupi
Keyword(s):  
Noise Parameters ◽  
Device Noise

Free-Space Characterization of Radar Absorbing Non-Magnetic Materials in the W-Band

2020 ◽  
Author(s):  
Nagma Vohra ◽  
Luis R. Rodriguez-Aguilar ◽  
Jose Santos Batista ◽  
Magda El-Shenawee
Keyword(s):  
Magnetic Materials ◽  
Free Space ◽  
W Band ◽  
Space Characterization

Arbitrary wideband open-loop active load-pull measurement using Unequally Spaced Multi-Tone stimulus

2020 ◽  
Author(s):  
Vincent Gillet ◽  
Jan Verspecht ◽  
Jean-Pierre Teyssier ◽  
Michel Prigent ◽  
Raymond Quere
Keyword(s):  
Open Loop ◽  
Tone Stimulus ◽  
Unequally Spaced ◽  
Active Load ◽  
Load Pull

scholarly journals An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz

2020 ◽  
Author(s):  
Roland G. Clarke ◽  
Xiaobang Shang ◽  
Nick M. Ridler ◽  
Roger Lozar ◽  
Thorsten Probst ◽  
...  
Keyword(s):  
Interlaboratory Study ◽  
S Parameter
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