1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

078030036x

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Misfit stress in p/p+ epitaxial silicon wafers: effect and elimination

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246712 ◽

2002 ◽

Cited By ~ 1

Author(s):

W. Lin ◽

D.W. Hill ◽

C.L. Paulnack ◽

M.J. Kelly

Keyword(s):

Silicon Wafers ◽

Epitaxial Silicon ◽

Misfit Stress

Download Full-text

A deep-submicrometer raised source/drain LDD structure fabricated using hot-wall epitaxy

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246698 ◽

2002 ◽

Author(s):

J.E. Moon ◽

C. Galewski ◽

T. Garfinkel ◽

M. Wong ◽

W.G. Oldham ◽

...

Keyword(s):

Deep Submicrometer ◽

Hot Wall Epitaxy

Download Full-text

Advanced bipolar circuits-a perspective

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246748 ◽

2002 ◽

Author(s):

C.T. Chuang

Download Full-text

A design and implementation of multi-dimensional Y-C separation filters for NTSC TV signals

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246673 ◽

2002 ◽

Author(s):

K. Ashizawa ◽

T. Yoshida ◽

A. Nishihara

Keyword(s):

Design And Implementation

Download Full-text

Extraction of defect characteristics for yield estimation using the double bridge test structure

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246755 ◽

2002 ◽

Cited By ~ 1

Author(s):

J.B. Khare ◽

B.J. Daniels ◽

D.M. Campbell ◽

M.E. Thomas ◽

W. Maly

Keyword(s):

Test Structure ◽

Yield Estimation

Download Full-text

A new MOSFET hot carrier model in SPICE feasible for VLSI reliability analysis

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246664 ◽

2002 ◽

Cited By ~ 2

Author(s):

S.S. Chung ◽

P.-C. Hsu ◽

J.-S. Lee

Keyword(s):

Reliability Analysis ◽

Hot Carrier ◽

Carrier Model

Download Full-text

DRAM technology trend and prospect

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246734 ◽

2002 ◽

Cited By ~ 1

Author(s):

H. Shichijo

Keyword(s):

Technology Trend

Download Full-text

Modeling and design analysis of a workstation LAN server

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246738 ◽

2002 ◽

Author(s):

F.W. Shih ◽

Jyh-Herng Chow ◽

Shauchi Ong ◽

Limin Hu

Keyword(s):

Design Analysis

Download Full-text

Depletion region formation at low temperatures

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246666 ◽

2002 ◽

Author(s):

C.R. Viswanathan ◽

R. Divakaruni ◽

V. Prabhakar

Keyword(s):

Low Temperatures ◽

Depletion Region

Download Full-text

Electron beam direct writing systems for 64 Mbit DRAM and beyond

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246717 ◽

2002 ◽

Author(s):

K. Nakamura ◽

N. Saitou

Keyword(s):

Electron Beam ◽

Direct Writing ◽

Writing Systems

Download Full-text

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical PapersLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Misfit stress in p/p+ epitaxial silicon wafers: effect and elimination

A deep-submicrometer raised source/drain LDD structure fabricated using hot-wall epitaxy

Advanced bipolar circuits-a perspective

A design and implementation of multi-dimensional Y-C separation filters for NTSC TV signals

Extraction of defect characteristics for yield estimation using the double bridge test structure

A new MOSFET hot carrier model in SPICE feasible for VLSI reliability analysis

DRAM technology trend and prospect

Modeling and design analysis of a workstation LAN server

Depletion region formation at low temperatures

Electron beam direct writing systems for 64 Mbit DRAM and beyond

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers
Latest Publications