Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Latest Publications

TOTAL DOCUMENTS

201

(FIVE YEARS 201)

H-INDEX

1

(FIVE YEARS 1)

Published By SPIE

9781510631731, 9781510631748

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Design of high efficiency ITO phase/intensity modulator based on ultra-thin silicon strip waveguide

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542762 ◽

2019 ◽

Author(s):

Yingxin Kuang ◽

Xingrui Huang ◽

Rui Jiang ◽

Huan Guan ◽

Qingquan Wei ◽

...

Keyword(s):

High Efficiency ◽

Intensity Modulator ◽

Strip Waveguide ◽

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Electronic, optical properties, and effective masses of AlxGa1−xAs and InyGa1−yAs based on the first principle

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542227 ◽

2019 ◽

Author(s):

Congcong Wang ◽

Chong Li ◽

Xuesheng Liu ◽

Tian Lan ◽

Guangzheng Zhou ◽

...

Keyword(s):

Optical Properties ◽

First Principle ◽

Effective Masses

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Investigation of cavity confinement enhancing effect in femtosecond laser induced breakdown spectroscopy

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542880 ◽

2019 ◽

Author(s):

Zhao Shangyong ◽

Dai Yujia ◽

Wang Xingsheng ◽

Ren Jia ◽

Xu Donghua ◽

...

Keyword(s):

Femtosecond Laser ◽

Laser Induced Breakdown Spectroscopy ◽

Enhancing Effect ◽

Breakdown Spectroscopy ◽

Laser Induced Breakdown

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Ultra-precision grinding of transparent AlON optical window

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542410 ◽

2019 ◽

Author(s):

Chunyu Zhang ◽

Han Liu ◽

Qingliang Zhao ◽

Bing Guo ◽

Jinhu Wang

Keyword(s):

Precision Grinding ◽

Optical Window ◽

Ultra Precision

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Low-dose CT with a deep convolutional neural network blocks model using mean squared error loss and structural similar loss

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542662 ◽

2019 ◽

Author(s):

Yinjin Ma ◽

Peng Feng ◽

Peng He ◽

Zourong Long ◽

Biao Wei

Keyword(s):

Neural Network ◽

Convolutional Neural Network ◽

Low Dose ◽

Mean Squared Error ◽

Deep Convolutional Neural Network ◽

Squared Error Loss ◽

Low Dose Ct ◽

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Raman spectral properties of Fenbendazole molecules

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542644 ◽

2019 ◽

Author(s):

Shuai Lian ◽

Jiahe Liu ◽

Jiazhe Lu ◽

Yifan Gu ◽

Xun Gao ◽

...

Keyword(s):

Spectral Properties ◽

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Tilt interferometer for detecting gravitational wave signals at high frequencies

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542601 ◽

2019 ◽

Author(s):

Shenghua Yu ◽

Chunnong Zhao ◽

David Blair ◽

Carl Blair ◽

Jian Liu ◽

...

Keyword(s):

Gravitational Wave ◽

High Frequencies

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Ultra-long optical needles with controllable homogeneously 3D spin-orientation produced with an annular spherical mirror

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2542298 ◽

2019 ◽

Author(s):

Hang Li ◽

Ying Wang ◽

Peifeng Chen

Keyword(s):

Spherical Mirror ◽

Spin Orientation

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Relative intensity noise suppression of intensity modulator and semiconductor optical amplifier

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2543854 ◽

2019 ◽

Author(s):

Xin Liu ◽

Xiaxiao Wang ◽

Jia Yu ◽

Rui Gan

Keyword(s):

Relative Intensity ◽

Semiconductor Optical Amplifier ◽

Noise Suppression ◽

Optical Amplifier ◽

Relative Intensity Noise ◽

Intensity Noise ◽

Intensity Modulator

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In-situ absolute measurement method for reference surface error of large aperture interferometer based on oblique incidence

Eleventh International Conference on Information Optics and Photonics (CIOP 2019) ◽

10.1117/12.2547402 ◽

2019 ◽

Author(s):

You Zhou ◽

Shijie Liu ◽

Yunbo Bai ◽

Longbo Xu ◽

Jianda Shao

Keyword(s):

Measurement Method ◽

Oblique Incidence ◽

Absolute Measurement ◽

Reference Surface ◽

Surface Error ◽

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