2010 28th VLSI Test Symposium (VTS)
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9781424466498
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scholarly journals Concurrent autonomous self-test for uncore components in system-on-chips

2010 ◽  
Author(s):  
Yanjing Li ◽  
Onur Mutlu ◽  
Donald S. Gardner ◽  
Subhasish Mitra
Keyword(s):  
Self Test

Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures

2010 ◽  
Author(s):  
Shyam Kumar Devarakond ◽  
Shreyas Sen ◽  
Soumendu Bhattacharya ◽  
Abhijit Chatterjee
Keyword(s):  
Process Model ◽  
Concurrent Process ◽  
Effect Monitoring

Board-level fault diagnosis using Bayesian inference

2010 ◽  
Author(s):  
Zhaobo Zhang ◽  
Zhanglei Wang ◽  
Xinli Gu ◽  
Krishnendu Chakrabarty
Keyword(s):  
Bayesian Inference ◽  
Fault Diagnosis ◽  
Board Level
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