2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop
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9781424446186

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Using stochastic differential equation for assertion based verification of noise in analog/RF circuits

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158696 ◽

2009 ◽

Cited By ~ 2

Author(s):

Rajeev Narayanan ◽

Mohamed H. Zaki ◽

Sofiene Tahar

Keyword(s):

Differential Equation ◽

Stochastic Differential Equation ◽

Rf Circuits

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BIST-assisted power aware self healing RF circuits

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158691 ◽

2009 ◽

Cited By ~ 7

Author(s):

Shyam Kumar Devarakond ◽

Vishwanath Natarajan ◽

Shreyas Sen ◽

Abhijit Chatterjee

Keyword(s):

Rf Circuits ◽

Self Healing

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Closed-loop Built in Self Test for PLL production testing with minimal tester resources

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158687 ◽

2009 ◽

Cited By ~ 2

Author(s):

Sachin Dasnurkar ◽

Jacob Abraham

Keyword(s):

Closed Loop ◽

Production Testing ◽

Self Test ◽

Built In Self Test

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Demonstration of 20 Gbps digital test signal synthesis using SiGe and InP logic

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158693 ◽

2009 ◽

Cited By ~ 2

Author(s):

D.C. Keezer ◽

C. Gray ◽

D. Minier ◽

P. Ducharme

Keyword(s):

Test Signal ◽

Signal Synthesis ◽

Digital Test

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Design for modular testing of a multilayer flexible wireless multisensor platform

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158698 ◽

2009 ◽

Author(s):

Yindar Chuo ◽

Bozena Kaminska

Keyword(s):

Modular Testing

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Vector based Analog to Digital Converter sequential testing methodology to minimize ATE memory and analysis requirements

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158697 ◽

2009 ◽

Cited By ~ 5

Author(s):

Sachin Dileep Dasnurkar ◽

Jacob A. Abraham

Keyword(s):

Sequential Testing ◽

Analog To Digital Converter ◽

Digital Converter ◽

Analog To Digital ◽

Testing Methodology

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[Front matter]

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158701 ◽

2009 ◽

Download Full-text

Defect-based analog fault coverage analysis using mixed-mode fault simulation

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158688 ◽

2009 ◽

Cited By ~ 14

Author(s):

Joonsung Parky ◽

Srinadh Madhavapeddiz ◽

Alessandro Paglieri ◽

Chris Barrz ◽

Jacob A. Abrahamy

Keyword(s):

Mixed Mode ◽

Fault Simulation ◽

Fault Coverage ◽

Coverage Analysis

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A method for electrical calibration of MEMS accelerometers through multivariate regression

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158685 ◽

2009 ◽

Cited By ~ 2

Author(s):

N. Dumas ◽

F. Azais ◽

F. Mailly ◽

P. Nouet

Keyword(s):

Multivariate Regression ◽

Mems Accelerometers ◽

Electrical Calibration

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Applications for low frequency impedance analysis systems

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2009.5158694 ◽

2009 ◽

Cited By ~ 1

Author(s):

Matthew Giassa ◽

Ajit Khosla ◽

Bonnie Gray ◽

Ash Parameswaran ◽

Kirpal Kholi ◽

...

Keyword(s):

Low Frequency ◽

Impedance Analysis

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2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test WorkshopLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Using stochastic differential equation for assertion based verification of noise in analog/RF circuits

BIST-assisted power aware self healing RF circuits

Closed-loop Built in Self Test for PLL production testing with minimal tester resources

Demonstration of 20 Gbps digital test signal synthesis using SiGe and InP logic

Design for modular testing of a multilayer flexible wireless multisensor platform

Vector based Analog to Digital Converter sequential testing methodology to minimize ATE memory and analysis requirements

[Front matter]

Defect-based analog fault coverage analysis using mixed-mode fault simulation

A method for electrical calibration of MEMS accelerometers through multivariate regression

Applications for low frequency impedance analysis systems

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop
Latest Publications