Particles on Surfaces 2
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25

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3

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Published By Springer US

9781461278528, 9781461305316

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Adhesion of Ash Particles on Heat Transfer Surfaces in Coal Combustion Applications: Mechanisms and Implications

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_8 ◽

1989 ◽

pp. 87-97

Author(s):

R. Nagarajan

Keyword(s):

Heat Transfer ◽

Coal Combustion

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Particle Reduction on Silicon Wafers as a Result of Isopropyl Alcohol Vapor Displacement drying after Wet Processing

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_19 ◽

1989 ◽

pp. 235-243 ◽

Author(s):

Joan W. Koppenbrink ◽

Christopher F. McConnell ◽

Alan E. Walter

Keyword(s):

Isopropyl Alcohol ◽

Silicon Wafers ◽

Alcohol Vapor ◽

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Wear Resistant Coatings Reduce Particulate Contamination in a Magnetic Disk Drive

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_18 ◽

1989 ◽

pp. 217-234

Author(s):

Wendy Jones ◽

John McDowell ◽

Walter Prater ◽

Garvin Stone

Keyword(s):

Wear Resistant ◽

Magnetic Disk ◽

Wear Resistant Coatings ◽

Particulate Contamination

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The Evaluation of PWA and SMA Cleanliness Levels for “In-Line” Defluxing by High Performance Liquid Chromatography

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_17 ◽

1989 ◽

pp. 201-213

Author(s):

R. F. Klima ◽

J. K. Bonner

Keyword(s):

High Performance Liquid Chromatography ◽

Liquid Chromatography ◽

High Performance

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Surface Particle Inspection Plans in Semiconductor Manufacturing

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_14 ◽

1989 ◽

pp. 181-188

Author(s):

Zinovy Fichtenholz ◽

Leon L. Pesotchinsky

Keyword(s):

Semiconductor Manufacturing ◽

Surface Particle

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The Role of Infrared and Raman Microspectroscopies in the Characterization of Particles on Surfaces

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_10 ◽

1989 ◽

pp. 115-142 ◽

Author(s):

Kenneth J. Ward ◽

David R. Tallant

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Ultrasonic and Hydrodynamic Techniques for Particle Removal from Silicon Wafers

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_24 ◽

1989 ◽

pp. 297-306 ◽

Author(s):

V. B. Menon ◽

L. D. Michaels ◽

R. P. Donovan ◽

D. S. Ensor

Keyword(s):

Silicon Wafers ◽

Particle Removal

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The Effect of External Noises on the Attachment of Particles to Solid Surfaces

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_5 ◽

1989 ◽

pp. 59-66

Author(s):

J. P. Hsu

Keyword(s):

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Implications of Particulate Contamination in E-Beam Lithography

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_21 ◽

1989 ◽

pp. 253-265 ◽

Author(s):

Robert L. Dean

Keyword(s):

Particulate Contamination

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Particulate Generation and Detection on Surfaces

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_15 ◽

1989 ◽

pp. 189-194

Author(s):

Marvin Fein

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